Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium: proceedings 1996 ; Austin, TX, USA, March 5-7, 1996
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Piscataway, NJ
IEEE
1996
|
| Subjects: | |
| Physical Description: | XIII, 251 S. Ill., graph. Darst. |
| ISBN: | 0780331397 0780331400 0780331419 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV011285031 | ||
| 003 | DE-604 | ||
| 005 | 20070806 | ||
| 007 | t | ||
| 008 | 970407s1996 ad|| |||| 10||| eng d | ||
| 020 | |a 0780331397 |9 0-7803-3139-7 | ||
| 020 | |a 0780331400 |9 0-7803-3140-0 | ||
| 020 | |a 0780331419 |9 0-7803-3141-9 | ||
| 035 | |a (OCoLC)35324149 | ||
| 035 | |a (DE-599)BVBBV011285031 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-384 |a DE-83 | ||
| 050 | 0 | |a QC611.6.T4 | |
| 082 | 0 | |a 621.382 |2 20 | |
| 084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
| 111 | 2 | |a Semiconductor Thermal Measurement and Management Symposium |n 12 |d 1996 |c Austin, Tex. |j Verfasser |0 (DE-588)5197185-9 |4 aut | |
| 245 | 1 | 0 | |a Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium |b proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| 264 | 1 | |a Piscataway, NJ |b IEEE |c 1996 | |
| 300 | |a XIII, 251 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Semiconductors |x Cooling |v Congresses | |
| 650 | 4 | |a Semiconductors |x Thermal properties |v Congresses | |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Thermische Belastung |0 (DE-588)4059816-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Messung |0 (DE-588)4038852-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1996 |z Austin Tex. |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Thermische Belastung |0 (DE-588)4059816-0 |D s |
| 689 | 0 | 2 | |a Messung |0 (DE-588)4038852-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007578584 | ||
Record in the Search Index
| _version_ | 1804125789771268096 |
|---|---|
| any_adam_object | |
| author_corporate | Semiconductor Thermal Measurement and Management Symposium Austin, Tex |
| author_corporate_role | aut |
| author_facet | Semiconductor Thermal Measurement and Management Symposium Austin, Tex |
| author_sort | Semiconductor Thermal Measurement and Management Symposium Austin, Tex |
| building | Verbundindex |
| bvnumber | BV011285031 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.6.T4 |
| callnumber-search | QC611.6.T4 |
| callnumber-sort | QC 3611.6 T4 |
| callnumber-subject | QC - Physics |
| classification_rvk | ZN 4800 |
| ctrlnum | (OCoLC)35324149 (DE-599)BVBBV011285031 |
| dewey-full | 621.382 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.382 |
| dewey-search | 621.382 |
| dewey-sort | 3621.382 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01655nam a2200433 c 4500</leader><controlfield tag="001">BV011285031</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20070806 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">970407s1996 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780331397</subfield><subfield code="9">0-7803-3139-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780331400</subfield><subfield code="9">0-7803-3140-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780331419</subfield><subfield code="9">0-7803-3141-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)35324149</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011285031</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC611.6.T4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.382</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4800</subfield><subfield code="0">(DE-625)157408:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Semiconductor Thermal Measurement and Management Symposium</subfield><subfield code="n">12</subfield><subfield code="d">1996</subfield><subfield code="c">Austin, Tex.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5197185-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium</subfield><subfield code="b">proceedings 1996 ; Austin, TX, USA, March 5-7, 1996</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 251 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Cooling</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Thermal properties</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Thermische Belastung</subfield><subfield code="0">(DE-588)4059816-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messung</subfield><subfield code="0">(DE-588)4038852-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1996</subfield><subfield code="z">Austin Tex.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Thermische Belastung</subfield><subfield code="0">(DE-588)4059816-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Messung</subfield><subfield code="0">(DE-588)4038852-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007578584</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1996 Austin Tex. gnd-content |
| genre_facet | Konferenzschrift 1996 Austin Tex. |
| id | DE-604.BV011285031 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:07:09Z |
| institution | BVB |
| institution_GND | (DE-588)5197185-9 |
| isbn | 0780331397 0780331400 0780331419 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007578584 |
| oclc_num | 35324149 |
| open_access_boolean | |
| owner | DE-384 DE-83 |
| owner_facet | DE-384 DE-83 |
| physical | XIII, 251 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | IEEE |
| record_format | marc |
| spelling | Semiconductor Thermal Measurement and Management Symposium 12 1996 Austin, Tex. Verfasser (DE-588)5197185-9 aut Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 Piscataway, NJ IEEE 1996 XIII, 251 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Thermische Belastung (DE-588)4059816-0 gnd rswk-swf Messung (DE-588)4038852-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1996 Austin Tex. gnd-content Halbleiterbauelement (DE-588)4113826-0 s Thermische Belastung (DE-588)4059816-0 s Messung (DE-588)4038852-9 s DE-604 |
| spellingShingle | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement (DE-588)4113826-0 gnd Thermische Belastung (DE-588)4059816-0 gnd Messung (DE-588)4038852-9 gnd |
| subject_GND | (DE-588)4113826-0 (DE-588)4059816-0 (DE-588)4038852-9 (DE-588)1071861417 |
| title | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_auth | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_exact_search | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_full | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_fullStr | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_full_unstemmed | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_short | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| title_sort | twelfth annual ieee semiconductor thermal measurement and management symposium proceedings 1996 austin tx usa march 5 7 1996 |
| title_sub | proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| topic | Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement (DE-588)4113826-0 gnd Thermische Belastung (DE-588)4059816-0 gnd Messung (DE-588)4038852-9 gnd |
| topic_facet | Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement Thermische Belastung Messung Konferenzschrift 1996 Austin Tex. |
| work_keys_str_mv | AT semiconductorthermalmeasurementandmanagementsymposiumaustintex twelfthannualieeesemiconductorthermalmeasurementandmanagementsymposiumproceedings1996austintxusamarch571996 |