Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium: proceedings 1996 ; Austin, TX, USA, March 5-7, 1996
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
IEEE
1996
|
| Schlagworte: | |
| Beschreibung: | XIII, 251 S. Ill., graph. Darst. |
| ISBN: | 0780331397 0780331400 0780331419 |
Internformat
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Datensatz im Suchindex
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| genre_facet | Konferenzschrift 1996 Austin Tex. |
| id | DE-604.BV011285031 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:07:09Z |
| institution | BVB |
| institution_GND | (DE-588)5197185-9 |
| isbn | 0780331397 0780331400 0780331419 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007578584 |
| oclc_num | 35324149 |
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| physical | XIII, 251 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | IEEE |
| record_format | marc |
| spelling | Semiconductor Thermal Measurement and Management Symposium 12 1996 Austin, Tex. Verfasser (DE-588)5197185-9 aut Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 Piscataway, NJ IEEE 1996 XIII, 251 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Thermische Belastung (DE-588)4059816-0 gnd rswk-swf Messung (DE-588)4038852-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1996 Austin Tex. gnd-content Halbleiterbauelement (DE-588)4113826-0 s Thermische Belastung (DE-588)4059816-0 s Messung (DE-588)4038852-9 s DE-604 |
| spellingShingle | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement (DE-588)4113826-0 gnd Thermische Belastung (DE-588)4059816-0 gnd Messung (DE-588)4038852-9 gnd |
| subject_GND | (DE-588)4113826-0 (DE-588)4059816-0 (DE-588)4038852-9 (DE-588)1071861417 |
| title | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_auth | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_exact_search | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_full | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_fullStr | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_full_unstemmed | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| title_short | Twelfth annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| title_sort | twelfth annual ieee semiconductor thermal measurement and management symposium proceedings 1996 austin tx usa march 5 7 1996 |
| title_sub | proceedings 1996 ; Austin, TX, USA, March 5-7, 1996 |
| topic | Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement (DE-588)4113826-0 gnd Thermische Belastung (DE-588)4059816-0 gnd Messung (DE-588)4038852-9 gnd |
| topic_facet | Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Halbleiterbauelement Thermische Belastung Messung Konferenzschrift 1996 Austin Tex. |
| work_keys_str_mv | AT semiconductorthermalmeasurementandmanagementsymposiumaustintex twelfthannualieeesemiconductorthermalmeasurementandmanagementsymposiumproceedings1996austintxusamarch571996 |