Proceedings of the fifth Asian Test Symposium: November 20 - 22, 1996, Hsinchu, Taiwan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc. Pr.
1996
|
| Schlagworte: | |
| Beschreibung: | XVIII, 303 S. Ill., graph. Darst. |
| ISBN: | 0818674784 |
Internformat
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| 245 | 1 | 0 | |a Proceedings of the fifth Asian Test Symposium |b November 20 - 22, 1996, Hsinchu, Taiwan |c (ATS '96) |
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| 650 | 4 | |a Fault-tolerant computing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
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Datensatz im Suchindex
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| author_corporate | Asian Test Symposium Hsinchu |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift |
| id | DE-604.BV011095616 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T13:15:58Z |
| institution | BVB |
| institution_GND | (DE-588)5207458-4 |
| isbn | 0818674784 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007432744 |
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| physical | XVIII, 303 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | IEEE Computer Soc. Pr. |
| record_format | marc |
| spelling | Asian Test Symposium 5 1996 Hsinchu Verfasser (DE-588)5207458-4 aut Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan (ATS '96) ATS '96 Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Pr. 1996 XVIII, 303 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan |
| title_alt | ATS '96 |
| title_auth | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan |
| title_exact_search | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan |
| title_full | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan (ATS '96) |
| title_fullStr | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan (ATS '96) |
| title_full_unstemmed | Proceedings of the fifth Asian Test Symposium November 20 - 22, 1996, Hsinchu, Taiwan (ATS '96) |
| title_short | Proceedings of the fifth Asian Test Symposium |
| title_sort | proceedings of the fifth asian test symposium november 20 22 1996 hsinchu taiwan |
| title_sub | November 20 - 22, 1996, Hsinchu, Taiwan |
| topic | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| topic_facet | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses Konferenzschrift |
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