Equal distance sampling of superellipse models:

Abstract: "Superellipses are parametric models that can be used for representing two dimensional object parts or aspects of 3-D parts. Previously little care was given to obtaining a precise sampling of the contour of these models. Equal-distance sampling of superellipse model contours is howev...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Pilu, Maurizio (VerfasserIn), Fisher, Robert B. (VerfasserIn)
Format: Buch
Sprache:English
Veröffentlicht: Edinburgh 1995
Schlagworte:
Zusammenfassung:Abstract: "Superellipses are parametric models that can be used for representing two dimensional object parts or aspects of 3-D parts. Previously little care was given to obtaining a precise sampling of the contour of these models. Equal-distance sampling of superellipse model contours is however important for rendering and in cases in which a cost function needs to be estimated for data fitting or parameter estimation, such as in model-based optimisation. In this paper we present a new parametric method for achieving equal-distance sampling of superellipse model contours that properly combines two simple first order models of the sampled points distance function. We also show how to extend the method to deformable superellipses and superquadrics."
Beschreibung:[10] S. graph. Darst.

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