Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing: June 25 - 27, 1996, Sendai, Japan
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc. Press
1996
|
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | NST: Digest of papers |
Beschreibung: | XXVI, 442 S. graph. Darst. |
ISBN: | 0818672617 0818672625 0818672633 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV010989048 | ||
003 | DE-604 | ||
005 | 19970512 | ||
007 | t| | ||
008 | 961008s1996 xx d||| |||| 10||| eng d | ||
020 | |a 0818672617 |9 0-8186-7261-7 | ||
020 | |a 0818672625 |9 0-8186-7262-5 | ||
020 | |a 0818672633 |9 0-8186-7263-3 | ||
035 | |a (OCoLC)605195518 | ||
035 | |a (DE-599)BVBBV010989048 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-739 |a DE-91G |a DE-91 |a DE-634 |a DE-83 | ||
050 | 0 | |a QA76.9.F38 | |
082 | 0 | |a 004.2 | |
084 | |a ST 233 |0 (DE-625)143620: |2 rvk | ||
084 | |a DAT 286f |2 stub | ||
111 | 2 | |a International Symposium on Fault Tolerant Computing |n 26 |d 1996 |c Sendai |j Verfasser |0 (DE-588)1900921-5 |4 aut | |
245 | 1 | 0 | |a Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing |b June 25 - 27, 1996, Sendai, Japan |
246 | 1 | 3 | |a Proceedings of the Twenty-sixth International Symposium on Fault-Tolerant Computing |
246 | 1 | 3 | |a Digest of papers |
264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. Press |c 1996 | |
300 | |a XXVI, 442 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a NST: Digest of papers | ||
650 | 7 | |a Tolérance aux fautes (informatique) - Congrès |2 ram | |
650 | 7 | |a code correcteur erreur |2 inriac | |
650 | 7 | |a contrôle erreur |2 inriac | |
650 | 7 | |a diagnostic panne |2 inriac | |
650 | 7 | |a injection erreur |2 inriac | |
650 | 7 | |a système parallèle |2 inriac | |
650 | 7 | |a système réparti |2 inriac | |
650 | 7 | |a test erreur |2 inriac | |
650 | 7 | |a testabilité |2 inriac | |
650 | 7 | |a tolérance panne |2 inriac | |
650 | 7 | |a vérification |2 inriac | |
650 | 7 | |a évaluation fiabilité |2 inriac | |
650 | 4 | |a Electronic digital computers |v Congresses | |
650 | 4 | |a Fault-tolerant computing |v Congresses | |
650 | 0 | 7 | |a Datenverarbeitung |0 (DE-588)4011152-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Fehlertoleranz |0 (DE-588)4123192-2 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1996 |z Sendai |2 gnd-content | |
689 | 0 | 0 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
689 | 0 | 1 | |a Datenverarbeitung |0 (DE-588)4011152-0 |D s |
689 | 0 | |5 DE-604 | |
856 | 4 | 2 | |m Digitalisierung TU Muenchen |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007355114&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-007355114 |
Datensatz im Suchindex
_version_ | 1822490837852880896 |
---|---|
adam_text |
Proceedings
ofFTCS-ló
Table of Contents
Message from the General Chair
.xi
Message from the Conference Chair
.xii
Message from the Program Chairs
.xiv
FTCS-26 Organizing Committee
.xvi
Conference Committee
.xviii
Program Committee
.xx
Fund Raising Committee
.xxii
Reviewers
.xxiii
Panel
1 —
"Availability of Commercial Parallel Systems"
Moderator: Jen-Yao Chung
-
IBM T.J. Watson Research Center
.2
Panelists: Nicholas S. Bowen
-
IBM T.J. Watson Research Center
Mei-Chen Hsueh
-
University of Illinois at Urbana-Champaign
(on leave from Digital Equipment Corporation)
Ravishankar K. Iyer
-
University of Illinois at Urbana-Champaign
Mitsuhiro Kishimoto
-
Fujitsu Laboratories Ltd.
Luiz A. Laranjeira
-
Tandem Computers Inc.
Session
Al
—
Distributed Systems
Chair: Hermann Kopetz
-
Austria
Reconfiguration and Transient Recovery in State Machine Architectures
.6
J. Rushby
Recoverable Mobile Environment: Design and Trade-Off Analysis
. 16
D.K. Pradhan, P. Krishna, andN.H. Vaidya
Evaluating Quorum Systems over the Internet
.26
Y. Amir and A. Wool
Session B1
—
Testing
Chair: Hirokazu Ihara
-
Japan
A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits
.38
N.
Itazaki, Y. Idomoto, and K. Kinoshita
Random Pattern Testing for Sequential Circuits Revisited
.44
L. Nachman, K.K. Saluja, S. Upadhyaya, and R. Reuse
Dynamic Test Compaction for Synchronous Sequential Circuits Using Static Compaction
Techniques
.53
/.
Pomeranz and S.M. Reddy
Session A2 — File Systems
Chair:
Ambuj Goyal
- USA
FT-NFS:
An Efficient Fault-Tolerant NFS
Server
Designed for
Off-the-Shelf Workstations . 64
N.
Peyrouze and G.
Muller
Design and Evaluation of Fault-Tolerant Shared File System for Cluster Systems
.74
S. Sumimoto
Session B2
—
Diagnosis
Chair: Arun Somani
-
USA
Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs
.86
N.
Yanagida, H. Takahashi, and Y. Takamatsu
Fault Diagnosis Using State Information
.96
V. Boppana, I. Hartanto, and W.K.
Fuchs
Session
A3 —
Evaluation
Chair: Shunji Osaki
-
Japan
Modeling the Dependability of CAUTRA, a Subset of the French Air Traffic Control
System
. 106
K. Kanoun, M.
Borrel,
T. Morteveille,
and A. Peytavin
A New Methodology for Calculating Distributions of Reward Accumulated During a
Finite Interval
. 116
МЛ.
Qureshi and W.H. Sanders
Session B3
—
On-Une Checking
Chair: Yoshihiro Tohma
-
Japan
Algebraic Techniques for the Optimization of Control Flow Checking
. 128
G
Noubir and B. Y. Choueiry
Executable Assertions and Timed Traces for On-Line Software Error Detection
. 138
С
Rabéjac, J-P.
Blanquart, andJ-P. Queille
"
Panel
2 —
"Dependability of Railway Control Systems"
Moderators: Jean Arlat
-
LAAS-CNRS, and Nobuyasu Kanekawa
-
Hitachi Ltd.
. 150
Panelists:
Arturo
M.
Arriendóla
-
Arnaldo Trasporti
-
Naples
Jean-Louis Dufour
-
Matra Transport
International
-
Montrouge
Yuji Hirao
-
Railway Technical
Research
Institute
-
Tokyo
Joseph A. Profeta
Ш
-
Union
Switch and Signal - Pittsburgh
Session
A4 —
Group
Communication
Chair:
Rick Schlichting - USA
A Multiple Bus Broadcast Protocol Resilient to Non-Cooperative Byzantine Faults
. 158
K. Echtle and A. Masum
vi
Consensus Service:
A Modular Approach for Building Agreement Protocols in Distributed
Systems
. 168
R. Guerraoui and A. Schiper
Group, Majority, and Strict Agreement in Timed Asynchronous Distributed Systems
. 178
F.
Cristian
Session B4
—
Coding
Chair: Jacob A. Abraham
-
USA
Optimal Two-Level Unequal Error Control Codes for Computer Systems
. 190
T. Ritthongpitak, M.
Kitakarni,
and E. Fujiwara
Symbol Error Correcting Codes for Memory Applications
.200
C.L Chen
Limitations of VLSI Implementation of Delay-Insensitive Codes
.208
V. Akella, N.H. Vaidya, and G.R. Redinbo
Session A5
—
Verification and Testing
Chair: Tohru Kikuno
-
Japan
Verification of Fault Tolerance and Real Time
.220
Z
Liu and M. Joseph
A Framework for Conformance Testing of Systems Communicating through Rendezvous
.230
Q.M. Tan, A. Petrenko, and G.
von Bochmann
Session B5
—
Design
Chair: Algirdas
Avižienis
-
USA
Mitigating Operator-Induced Unavailability by Matching Imprecise Queries
.240
R.A. Maxion and
P.A.
Syme
Supporting Nondeterministic Execution in Fault-Tolerant Systems
.250
J.H. Slye and E.N. Elnozahy
Session A6
—
Networks
Chair: Douglas M. Blough
-
USA
Reliable Broadcasting in Product Networks with Byzantine Faults
.262
F.
Bao
and Y. Igarashi
Hardware-Efficient and Highly-Reconfigurable
4-
and 2-Track Fault-Tolerant Designs for
Mesh-Connected Multicomputers
.272
N.R. Mahapatra and S. Dutt
Spare Processor Allocation for Fault Tolerance in Torus-Based Multicomputers
282
MM.
Вае
and B.
Bose
Session B6
—
Experiment and Analysis
Chair: John F. Meyer
-
USA
A Comparative Analysis of Event Tupling Schemes
294
M.F. Buckley and
O.P.
Siewiorek
VII
Generation
of an Error Set that Emulates Software Faults Based on Field Data
.304
J. Christmansson and R. Chillarege
An Approach towards Benchmarking of Fault-Tolerant Commercial Systems
.314
Т.К.
Tsai, R.K. Iyer, and D. Jewitt
Session A7
-
Self-Checking
Chair: Takashi Nanya
-
Japan
The Design of Totally Self-Checking Checkers for Some Classes of
Hadamard
Codes
.326
N.
Wakita, K. Takagi, and Y. Iwadare
Behavioral Synthesis of Fault Secure Controller/Datapaths Using Aliasing Probability
Analysis
.336
G. Lakshminarayana, A. Raghunathan, and N.K. Jha
Session B7
—
Practical Experience Reports I
Chair: Jean-Claude Laprie
-
France
Efficient Service of Rediscovered Software Problems
.348
1.
Lee, G. Pitt, and R.K. Iyer
Formal Methods for the Validation of Fault Tolerance in Autonomous Spacecraft
.353
S. Ayache, E. Conquet, P. Humbert, C. Rodriguez, J. Sifakis, and R. Gerlich
Session A8
—
Parallelization
Chair: Fumiyasu Hirose
-
Japan
Compiler-Assisted Generation of Error-Detecting Parallel Programs
.360
A. Roy-Chowdhury and P. Banerjee
Evaluation of Checkpoint Mechanisms for Massively Parallel Machines
.370
T. Chiueh and P. Deng
Session B8
—
Practical Experience Reports II
Chair: Basil Smith
-
USA
The Redundancy Mechanisms of the
Ariane 5
Operational Control Center
.382
J-L Dega
Highly Available Directory Services in DCE
.387
B. Acevedo,
L
Bahler, E.N. Elnozahy, V. Raton, and M.E. Segal
Session A9
-
Fault Injection
Chair: Jan Torin
-
Sweden
Experimental Evaluation of the Fail-Silent Behaviour in Programs with Consistency
Checks
.394
M.Z.
Rela,
H.
Madeira, andJ.G.
Silva
Testing of Fault-Tolerant and Real-Time Distributed Systems via Protocol Fault
Injection
.404
S. Dawson, F. Jahanian, T. Mitton, and
Т
-L
Tung
Experimental Assessment of Parallel Systems
.415
J.G.
Silva,
J.
Carreira,
H.
Madeira,
D.
Costa, and
F.
Moreira
vm
Session
В9
—
Practical Experience Reports III
Chair: Alain
Costes
-
France
Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy
.426
N.
Kanekawa, M. Nohmi, Y. Satoh, and H. Satoh
Technologies for Designing Dependable A/D Converters
.431
K.
Kaw
amura,
T.
Matsubara, and
Y.
Koga
Two Error-Detecting and Correcting Circuits for Space Applications
.436
R. Johansson
Author Index
.441
IX |
any_adam_object | 1 |
author_corporate | International Symposium on Fault Tolerant Computing Sendai |
author_corporate_role | aut |
author_facet | International Symposium on Fault Tolerant Computing Sendai |
author_sort | International Symposium on Fault Tolerant Computing Sendai |
building | Verbundindex |
bvnumber | BV010989048 |
callnumber-first | Q - Science |
callnumber-label | QA76 |
callnumber-raw | QA76.9.F38 |
callnumber-search | QA76.9.F38 |
callnumber-sort | QA 276.9 F38 |
callnumber-subject | QA - Mathematics |
classification_rvk | ST 233 |
classification_tum | DAT 286f |
ctrlnum | (OCoLC)605195518 (DE-599)BVBBV010989048 |
dewey-full | 004.2 |
dewey-hundreds | 000 - Computer science, information, general works |
dewey-ones | 004 - Computer science |
dewey-raw | 004.2 |
dewey-search | 004.2 |
dewey-sort | 14.2 |
dewey-tens | 000 - Computer science, information, general works |
discipline | Informatik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV010989048</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19970512</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">961008s1996 xx d||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818672617</subfield><subfield code="9">0-8186-7261-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818672625</subfield><subfield code="9">0-8186-7262-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818672633</subfield><subfield code="9">0-8186-7263-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)605195518</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV010989048</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QA76.9.F38</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">004.2</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 233</subfield><subfield code="0">(DE-625)143620:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">DAT 286f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Symposium on Fault Tolerant Computing</subfield><subfield code="n">26</subfield><subfield code="d">1996</subfield><subfield code="c">Sendai</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1900921-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing</subfield><subfield code="b">June 25 - 27, 1996, Sendai, Japan</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of the Twenty-sixth International Symposium on Fault-Tolerant Computing</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Digest of papers</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXVI, 442 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">NST: Digest of papers</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Tolérance aux fautes (informatique) - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">code correcteur erreur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">contrôle erreur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">diagnostic panne</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">injection erreur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">système parallèle</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">système réparti</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">test erreur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">testabilité</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">tolérance panne</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">vérification</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">évaluation fiabilité</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault-tolerant computing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitung</subfield><subfield code="0">(DE-588)4011152-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1996</subfield><subfield code="z">Sendai</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Datenverarbeitung</subfield><subfield code="0">(DE-588)4011152-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung TU Muenchen</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007355114&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007355114</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1996 Sendai gnd-content |
genre_facet | Konferenzschrift 1996 Sendai |
id | DE-604.BV010989048 |
illustrated | Illustrated |
indexdate | 2025-01-28T11:11:42Z |
institution | BVB |
institution_GND | (DE-588)1900921-5 |
isbn | 0818672617 0818672625 0818672633 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007355114 |
oclc_num | 605195518 |
open_access_boolean | |
owner | DE-739 DE-91G DE-BY-TUM DE-91 DE-BY-TUM DE-634 DE-83 |
owner_facet | DE-739 DE-91G DE-BY-TUM DE-91 DE-BY-TUM DE-634 DE-83 |
physical | XXVI, 442 S. graph. Darst. |
publishDate | 1996 |
publishDateSearch | 1996 |
publishDateSort | 1996 |
publisher | IEEE Computer Soc. Press |
record_format | marc |
spelling | International Symposium on Fault Tolerant Computing 26 1996 Sendai Verfasser (DE-588)1900921-5 aut Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan Proceedings of the Twenty-sixth International Symposium on Fault-Tolerant Computing Digest of papers Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press 1996 XXVI, 442 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier NST: Digest of papers Tolérance aux fautes (informatique) - Congrès ram code correcteur erreur inriac contrôle erreur inriac diagnostic panne inriac injection erreur inriac système parallèle inriac système réparti inriac test erreur inriac testabilité inriac tolérance panne inriac vérification inriac évaluation fiabilité inriac Electronic digital computers Congresses Fault-tolerant computing Congresses Datenverarbeitung (DE-588)4011152-0 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1996 Sendai gnd-content Fehlertoleranz (DE-588)4123192-2 s Datenverarbeitung (DE-588)4011152-0 s DE-604 Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007355114&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan Tolérance aux fautes (informatique) - Congrès ram code correcteur erreur inriac contrôle erreur inriac diagnostic panne inriac injection erreur inriac système parallèle inriac système réparti inriac test erreur inriac testabilité inriac tolérance panne inriac vérification inriac évaluation fiabilité inriac Electronic digital computers Congresses Fault-tolerant computing Congresses Datenverarbeitung (DE-588)4011152-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
subject_GND | (DE-588)4011152-0 (DE-588)4123192-2 (DE-588)1071861417 |
title | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan |
title_alt | Proceedings of the Twenty-sixth International Symposium on Fault-Tolerant Computing Digest of papers |
title_auth | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan |
title_exact_search | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan |
title_full | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan |
title_fullStr | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan |
title_full_unstemmed | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing June 25 - 27, 1996, Sendai, Japan |
title_short | Proceedings of the Twenty-sixth International Symposium on Fault Tolerant Computing |
title_sort | proceedings of the twenty sixth international symposium on fault tolerant computing june 25 27 1996 sendai japan |
title_sub | June 25 - 27, 1996, Sendai, Japan |
topic | Tolérance aux fautes (informatique) - Congrès ram code correcteur erreur inriac contrôle erreur inriac diagnostic panne inriac injection erreur inriac système parallèle inriac système réparti inriac test erreur inriac testabilité inriac tolérance panne inriac vérification inriac évaluation fiabilité inriac Electronic digital computers Congresses Fault-tolerant computing Congresses Datenverarbeitung (DE-588)4011152-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
topic_facet | Tolérance aux fautes (informatique) - Congrès code correcteur erreur contrôle erreur diagnostic panne injection erreur système parallèle système réparti test erreur testabilité tolérance panne vérification évaluation fiabilité Electronic digital computers Congresses Fault-tolerant computing Congresses Datenverarbeitung Fehlertoleranz Konferenzschrift 1996 Sendai |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007355114&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT internationalsymposiumonfaulttolerantcomputingsendai proceedingsofthetwentysixthinternationalsymposiumonfaulttolerantcomputingjune25271996sendaijapan AT internationalsymposiumonfaulttolerantcomputingsendai proceedingsofthetwentysixthinternationalsymposiumonfaulttolerantcomputing AT internationalsymposiumonfaulttolerantcomputingsendai digestofpapers |