Band tailings and deep defects in semiconductors:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Zürich-Uetikon
Scitec Publ.
1996
|
| Schriftenreihe: | Diffusion and defect data
Pt. A, Defect and diffusion forum ; 133 |
| Schlagworte: | |
| Beschreibung: | 149 S. graph. Darst. |
| ISBN: | 3908450187 |
Internformat
MARC
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|---|---|---|---|
| 001 | BV010895457 | ||
| 003 | DE-604 | ||
| 005 | 20080423 | ||
| 007 | t | ||
| 008 | 960812s1996 d||| |||| 00||| eng d | ||
| 020 | |a 3908450187 |9 3-908450-18-7 | ||
| 035 | |a (OCoLC)36179710 | ||
| 035 | |a (DE-599)BVBBV010895457 | ||
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| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-703 |a DE-706 | ||
| 050 | 0 | |a QC611.6.D4 | |
| 084 | |a UP 3250 |0 (DE-625)146380: |2 rvk | ||
| 100 | 1 | |a Teate, A. A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Band tailings and deep defects in semiconductors |c A. A. Teate and N. C. Halder |
| 264 | 1 | |a Zürich-Uetikon |b Scitec Publ. |c 1996 | |
| 300 | |a 149 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Diffusion and defect data : Pt. A, Defect and diffusion forum |v 133 | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 650 | 0 | 7 | |a Transporteigenschaft |0 (DE-588)4185924-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optische Eigenschaft |0 (DE-588)4123887-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mitteltemperatur |0 (DE-588)4125276-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | 2 | |a Mitteltemperatur |0 (DE-588)4125276-7 |D s |
| 689 | 0 | 3 | |a Transporteigenschaft |0 (DE-588)4185924-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 1 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 1 | 2 | |a Mitteltemperatur |0 (DE-588)4125276-7 |D s |
| 689 | 1 | 3 | |a Optische Eigenschaft |0 (DE-588)4123887-4 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Halder, N. C. |e Verfasser |4 aut | |
| 830 | 0 | |a Diffusion and defect data |v Pt. A, Defect and diffusion forum ; 133 |w (DE-604)BV002354187 |9 133 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007286493 | ||
Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Teate, A. A. Halder, N. C. |
| author_facet | Teate, A. A. Halder, N. C. |
| author_role | aut aut |
| author_sort | Teate, A. A. |
| author_variant | a a t aa aat n c h nc nch |
| building | Verbundindex |
| bvnumber | BV010895457 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.6.D4 |
| callnumber-search | QC611.6.D4 |
| callnumber-sort | QC 3611.6 D4 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 3250 |
| ctrlnum | (OCoLC)36179710 (DE-599)BVBBV010895457 |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV010895457 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:00:44Z |
| institution | BVB |
| isbn | 3908450187 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007286493 |
| oclc_num | 36179710 |
| open_access_boolean | |
| owner | DE-29T DE-703 DE-706 |
| owner_facet | DE-29T DE-703 DE-706 |
| physical | 149 S. graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Scitec Publ. |
| record_format | marc |
| series | Diffusion and defect data |
| series2 | Diffusion and defect data : Pt. A, Defect and diffusion forum |
| spelling | Teate, A. A. Verfasser aut Band tailings and deep defects in semiconductors A. A. Teate and N. C. Halder Zürich-Uetikon Scitec Publ. 1996 149 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Diffusion and defect data : Pt. A, Defect and diffusion forum 133 Semiconductors Defects Transporteigenschaft (DE-588)4185924-8 gnd rswk-swf Optische Eigenschaft (DE-588)4123887-4 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Mitteltemperatur (DE-588)4125276-7 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s Mitteltemperatur (DE-588)4125276-7 s Transporteigenschaft (DE-588)4185924-8 s DE-604 Optische Eigenschaft (DE-588)4123887-4 s Halder, N. C. Verfasser aut Diffusion and defect data Pt. A, Defect and diffusion forum ; 133 (DE-604)BV002354187 133 |
| spellingShingle | Teate, A. A. Halder, N. C. Band tailings and deep defects in semiconductors Diffusion and defect data Semiconductors Defects Transporteigenschaft (DE-588)4185924-8 gnd Optische Eigenschaft (DE-588)4123887-4 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd Mitteltemperatur (DE-588)4125276-7 gnd |
| subject_GND | (DE-588)4185924-8 (DE-588)4123887-4 (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)4125276-7 |
| title | Band tailings and deep defects in semiconductors |
| title_auth | Band tailings and deep defects in semiconductors |
| title_exact_search | Band tailings and deep defects in semiconductors |
| title_full | Band tailings and deep defects in semiconductors A. A. Teate and N. C. Halder |
| title_fullStr | Band tailings and deep defects in semiconductors A. A. Teate and N. C. Halder |
| title_full_unstemmed | Band tailings and deep defects in semiconductors A. A. Teate and N. C. Halder |
| title_short | Band tailings and deep defects in semiconductors |
| title_sort | band tailings and deep defects in semiconductors |
| topic | Semiconductors Defects Transporteigenschaft (DE-588)4185924-8 gnd Optische Eigenschaft (DE-588)4123887-4 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd Mitteltemperatur (DE-588)4125276-7 gnd |
| topic_facet | Semiconductors Defects Transporteigenschaft Optische Eigenschaft Gitterbaufehler Halbleiter Mitteltemperatur |
| volume_link | (DE-604)BV002354187 |
| work_keys_str_mv | AT teateaa bandtailingsanddeepdefectsinsemiconductors AT haldernc bandtailingsanddeepdefectsinsemiconductors |