Three-dimensional and unconventional imaging for industrial inspection and metrology: 23- 25 October 1995, Philadelphia, Pennsylvania
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Bibliographic Details
Format: Book
Language:Undetermined
Published: Bellingham, Wash. 1995
Series:Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 2599
Subjects:
Physical Description:VIII, 420 S. Ill., graph. Darst.
ISBN:081941963X

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