Electron beam, X-ray, and ion beam techniques for submicrometer lithographies III: March 15 - 16, 1984, Santa Clara, Calif.
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE, The Internat. Soc. for Opt. Engineering 1984
Series:Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 471
Subjects:
Physical Description:VI, 136 S.: Ill., graph. Darst.
ISBN:0892525061
089252667X

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