Materials reliability in microelectronics: 5 Symposium held April 17 - 21, 1995, San Francisco, California, U.S.A.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Pittsburg, Pa.
Materials Research Soc.
1995
|
| Schriftenreihe: | Materials Research Society: Materials Research Society symposium proceedings
391 |
| Schlagworte: | |
| Beschreibung: | XV, 523 S. Ill., graph. Darst. |
| ISBN: | 1558992944 |
Internformat
MARC
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Datensatz im Suchindex
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| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV010687191 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:57:13Z |
| institution | BVB |
| isbn | 1558992944 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007133522 |
| oclc_num | 33816210 |
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| owner | DE-384 |
| owner_facet | DE-384 |
| physical | XV, 523 S. Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposium proceedings |
| series2 | Materials Research Society: Materials Research Society symposium proceedings Materials Research Society symposium proceedings |
| spelling | Materials reliability in microelectronics 5 Symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. eds.: Anthony S. Oates ... Pittsburg, Pa. Materials Research Soc. 1995 XV, 523 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposium proceedings 391 Materials Research Society symposium proceedings ... Ciencia dos materiais em engenharia eletrica larpcal Confiabilidade (engenharia eletrica) larpcal Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses (DE-588)1071861417 Konferenzschrift gnd-content Thompson, Carl V. Sonstige oth Rodbell, Kenneth P. Sonstige oth (DE-604)BV010687162 5 Materials Research Society: Materials Research Society symposium proceedings 391 (DE-604)BV001899105 391 |
| spellingShingle | Materials reliability in microelectronics Materials Research Society: Materials Research Society symposium proceedings Ciencia dos materiais em engenharia eletrica larpcal Confiabilidade (engenharia eletrica) larpcal Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Materials reliability in microelectronics |
| title_auth | Materials reliability in microelectronics |
| title_exact_search | Materials reliability in microelectronics |
| title_full | Materials reliability in microelectronics 5 Symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. eds.: Anthony S. Oates ... |
| title_fullStr | Materials reliability in microelectronics 5 Symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. eds.: Anthony S. Oates ... |
| title_full_unstemmed | Materials reliability in microelectronics 5 Symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. eds.: Anthony S. Oates ... |
| title_short | Materials reliability in microelectronics |
| title_sort | materials reliability in microelectronics symposium held april 17 21 1995 san francisco california u s a |
| topic | Ciencia dos materiais em engenharia eletrica larpcal Confiabilidade (engenharia eletrica) larpcal Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses |
| topic_facet | Ciencia dos materiais em engenharia eletrica Confiabilidade (engenharia eletrica) Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Konferenzschrift |
| volume_link | (DE-604)BV010687162 (DE-604)BV001899105 |
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