Materials reliability in microelectronics V: symposium held April 17 - 21, 1995, San Francisco, California, U.S.A.
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Bibliographic Details
Format: Book
Language:English
Published: Pittsburgh, Pa. Materials Research Soc. 1995
Series:Materials Research Society: Materials Research Society symposia proceedings 391
Subjects:
Physical Description:XV, 523 S. Ill., zahlr. graph. Darst.
ISBN:1558992944

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