Materials reliability in microelectronics V: symposium held April 17 - 21, 1995, San Francisco, California, U.S.A.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Pittsburgh, Pa.
Materials Research Soc.
1995
|
| Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
391 |
| Schlagworte: | |
| Beschreibung: | XV, 523 S. Ill., zahlr. graph. Darst. |
| ISBN: | 1558992944 |
Internformat
MARC
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| 245 | 1 | 0 | |a Materials reliability in microelectronics V |b symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. |c ed.: Anthony S. Oates ... |
| 264 | 1 | |a Pittsburgh, Pa. |b Materials Research Soc. |c 1995 | |
| 300 | |a XV, 523 S. |b Ill., zahlr. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 391 | |
| 650 | 7 | |a Ciencia dos materiais em engenharia eletrica |2 larpcal | |
| 650 | 7 | |a Confiabilidade (engenharia eletrica) |2 larpcal | |
| 650 | 4 | |a Metallizing |v Congresses | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Microelectronics |x Reliability |v Congresses | |
| 650 | 4 | |a Microstructure |v Congresses | |
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Datensatz im Suchindex
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| callnumber-label | TK7874 |
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| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UD 8400 |
| ctrlnum | (OCoLC)33816210 (DE-599)BVBBV010631822 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1995 San Francisco Calif. gnd-content |
| genre_facet | Konferenzschrift 1995 San Francisco Calif. |
| id | DE-604.BV010631822 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:56:17Z |
| institution | BVB |
| isbn | 1558992944 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007092799 |
| oclc_num | 33816210 |
| open_access_boolean | |
| owner | DE-29T DE-703 |
| owner_facet | DE-29T DE-703 |
| physical | XV, 523 S. Ill., zahlr. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposia proceedings |
| series2 | Materials Research Society: Materials Research Society symposia proceedings |
| spelling | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. ed.: Anthony S. Oates ... Pittsburgh, Pa. Materials Research Soc. 1995 XV, 523 S. Ill., zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 391 Ciencia dos materiais em engenharia eletrica larpcal Confiabilidade (engenharia eletrica) larpcal Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1995 San Francisco Calif. gnd-content Mikroelektronik (DE-588)4039207-7 s Werkstoff (DE-588)4065579-9 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Oates, Anthony S. Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 391 (DE-604)BV001899105 391 |
| spellingShingle | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. Materials Research Society: Materials Research Society symposia proceedings Ciencia dos materiais em engenharia eletrica larpcal Confiabilidade (engenharia eletrica) larpcal Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Zuverlässigkeit (DE-588)4059245-5 gnd Werkstoff (DE-588)4065579-9 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4065579-9 (DE-588)4039207-7 (DE-588)1071861417 |
| title | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. |
| title_auth | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. |
| title_exact_search | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. |
| title_full | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. ed.: Anthony S. Oates ... |
| title_fullStr | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. ed.: Anthony S. Oates ... |
| title_full_unstemmed | Materials reliability in microelectronics V symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. ed.: Anthony S. Oates ... |
| title_short | Materials reliability in microelectronics V |
| title_sort | materials reliability in microelectronics v symposium held april 17 21 1995 san francisco california u s a |
| title_sub | symposium held April 17 - 21, 1995, San Francisco, California, U.S.A. |
| topic | Ciencia dos materiais em engenharia eletrica larpcal Confiabilidade (engenharia eletrica) larpcal Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Zuverlässigkeit (DE-588)4059245-5 gnd Werkstoff (DE-588)4065579-9 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| topic_facet | Ciencia dos materiais em engenharia eletrica Confiabilidade (engenharia eletrica) Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Zuverlässigkeit Werkstoff Mikroelektronik Konferenzschrift 1995 San Francisco Calif. |
| volume_link | (DE-604)BV001899105 |
| work_keys_str_mv | AT oatesanthonys materialsreliabilityinmicroelectronicsvsymposiumheldapril17211995sanfranciscocaliforniausa |