Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Mikrofilm Buch |
| Sprache: | English |
| Veröffentlicht: |
1992
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| Ausgabe: | [Mikrofiche-Ausg.] |
| Schlagworte: | |
| Beschreibung: | Zürich, Techn. Hochsch., Diss., 1992. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x. - Zsfassung in dt. Sprache |
| Beschreibung: | 112 S. zahlr. Ill., graph. Darst. |
Internformat
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| 100 | 1 | |a Stalder, Roland Ernst |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy |c presented by Roland Ernst Stalder |
| 250 | |a [Mikrofiche-Ausg.] | ||
| 264 | 1 | |c 1992 | |
| 300 | |a 112 S. |b zahlr. Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b h |2 rdamedia | ||
| 338 | |b he |2 rdacarrier | ||
| 500 | |a Zürich, Techn. Hochsch., Diss., 1992. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x. - Zsfassung in dt. Sprache | ||
| 650 | 0 | 7 | |a Kristallfläche |0 (DE-588)4151344-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Metallverbindungen |0 (DE-588)4169640-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Silicide |0 (DE-588)4268288-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Silicide |0 (DE-588)4268288-5 |D s |
| 689 | 0 | 1 | |a Metallverbindungen |0 (DE-588)4169640-2 |D s |
| 689 | 0 | 2 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 0 | 3 | |a Silicium |0 (DE-588)4077445-4 |D s |
| 689 | 0 | 4 | |a Kristallfläche |0 (DE-588)4151344-7 |D s |
| 689 | 0 | 5 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |D s |
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Datensatz im Suchindex
| _version_ | 1804125085882122240 |
|---|---|
| any_adam_object | |
| author | Stalder, Roland Ernst |
| author_facet | Stalder, Roland Ernst |
| author_role | aut |
| author_sort | Stalder, Roland Ernst |
| author_variant | r e s re res |
| building | Verbundindex |
| bvnumber | BV010611074 |
| classification_tum | PHY 650d PHY 136d |
| ctrlnum | (OCoLC)613946507 (DE-599)BVBBV010611074 |
| discipline | Physik |
| edition | [Mikrofiche-Ausg.] |
| format | Microfilm Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV010611074 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:55:57Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007079186 |
| oclc_num | 613946507 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-355 DE-BY-UBR DE-703 |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-355 DE-BY-UBR DE-703 |
| physical | 112 S. zahlr. Ill., graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| record_format | marc |
| spelling | Stalder, Roland Ernst Verfasser aut Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy presented by Roland Ernst Stalder [Mikrofiche-Ausg.] 1992 112 S. zahlr. Ill., graph. Darst. txt rdacontent h rdamedia he rdacarrier Zürich, Techn. Hochsch., Diss., 1992. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x. - Zsfassung in dt. Sprache Kristallfläche (DE-588)4151344-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf Metallverbindungen (DE-588)4169640-2 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Silicide (DE-588)4268288-5 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicide (DE-588)4268288-5 s Metallverbindungen (DE-588)4169640-2 s Dünne Schicht (DE-588)4136925-7 s Silicium (DE-588)4077445-4 s Kristallfläche (DE-588)4151344-7 s Rastertunnelmikroskopie (DE-588)4252995-5 s DE-604 |
| spellingShingle | Stalder, Roland Ernst Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy Kristallfläche (DE-588)4151344-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Silicium (DE-588)4077445-4 gnd Metallverbindungen (DE-588)4169640-2 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Silicide (DE-588)4268288-5 gnd |
| subject_GND | (DE-588)4151344-7 (DE-588)4136925-7 (DE-588)4077445-4 (DE-588)4169640-2 (DE-588)4252995-5 (DE-588)4268288-5 (DE-588)4113937-9 |
| title | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy |
| title_auth | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy |
| title_exact_search | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy |
| title_full | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy presented by Roland Ernst Stalder |
| title_fullStr | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy presented by Roland Ernst Stalder |
| title_full_unstemmed | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy presented by Roland Ernst Stalder |
| title_short | Surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy |
| title_sort | surface and interface properties of epitaxial silicides studied by scanning tunneling microscopy |
| topic | Kristallfläche (DE-588)4151344-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Silicium (DE-588)4077445-4 gnd Metallverbindungen (DE-588)4169640-2 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Silicide (DE-588)4268288-5 gnd |
| topic_facet | Kristallfläche Dünne Schicht Silicium Metallverbindungen Rastertunnelmikroskopie Silicide Hochschulschrift |
| work_keys_str_mv | AT stalderrolandernst surfaceandinterfacepropertiesofepitaxialsilicidesstudiedbyscanningtunnelingmicroscopy |