Papers presented at the Workshop on Development and Industrial Application of Scanning Probe Microscopes: (SXM-1), Munster, Germany, october 4 - 6, 1994
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Bibliographic Details
Corporate Author: Workshop on Development and Industrial Application of Scanning Probe Microscopes Münster (Westf) (Author)
Format: Conference Proceeding Book
Language:English
Published: Lausanne u.a. Elsevier 1995
Series:Thin solid films 264,2
Subjects:
Physical Description:X S., S. 136 - 305 Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!