Degradation von MOS-Bauelementen durch optische Generation von Ladungsträgern:
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Bibliographic Details
Main Author: Scharf, Stefan (Author)
Format: Thesis Book
Language:German
Published: Berlin HMI 1995
Series:Hahn-Meitner-Institut <Berlin>: Berichte des Hahn-Meitner-Instituts 530
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:125 S. zahlr. graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Indexes