Scanning and transmission electron microscopy: an introduction

This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production,...

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Bibliographic Details
Main Authors: Flegler, Stanley L. (Author), Heckman, John W. (Author), Klomparens, Karen L. (Author)
Format: Book
Language:English
Published: New York Freeman 1993
Subjects:
Summary:This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available.
Physical Description:VIII, 225 S. Ill., graph. Darst.
ISBN:0716770474

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