Scanning and transmission electron microscopy: an introduction
This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production,...
Gespeichert in:
Hauptverfasser: | , , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York
Freeman
1993
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Schlagworte: | |
Zusammenfassung: | This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available. |
Beschreibung: | VIII, 225 S. Ill., graph. Darst. |
ISBN: | 0716770474 |
Internformat
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264 | 1 | |a New York |b Freeman |c 1993 | |
300 | |a VIII, 225 S. |b Ill., graph. Darst. | ||
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337 | |b n |2 rdamedia | ||
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520 | 3 | |a This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available. | |
650 | 7 | |a Elektronenmicroscopie |2 gtt | |
650 | 4 | |a Microscopes électroniques à balayage | |
650 | 4 | |a Microscopes électroniques à transmission | |
650 | 7 | |a Microscopie électronique en transmission |2 ram | |
650 | 7 | |a Microscopie électronique à balayage |2 ram | |
650 | 4 | |a Scanning electron microscopy | |
650 | 4 | |a Transmission electron microscopy | |
650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Heckman, John W. |e Verfasser |4 aut | |
700 | 1 | |a Klomparens, Karen L. |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-007071788 |
Datensatz im Suchindex
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any_adam_object | |
author | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. |
author_facet | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. |
author_role | aut aut aut |
author_sort | Flegler, Stanley L. |
author_variant | s l f sl slf j w h jw jwh k l k kl klk |
building | Verbundindex |
bvnumber | BV010602417 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.S3 |
callnumber-search | QH212.S3 |
callnumber-sort | QH 3212 S3 |
callnumber-subject | QH - Natural History and Biology |
classification_rvk | UH 6300 |
ctrlnum | (OCoLC)27935831 (DE-599)BVBBV010602417 |
dewey-full | 502/.8/25 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502/.8/25 |
dewey-search | 502/.8/25 |
dewey-sort | 3502 18 225 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik |
format | Book |
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id | DE-604.BV010602417 |
illustrated | Illustrated |
indexdate | 2024-07-09T17:55:47Z |
institution | BVB |
isbn | 0716770474 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007071788 |
oclc_num | 27935831 |
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owner_facet | DE-703 |
physical | VIII, 225 S. Ill., graph. Darst. |
publishDate | 1993 |
publishDateSearch | 1993 |
publishDateSort | 1993 |
publisher | Freeman |
record_format | marc |
spelling | Flegler, Stanley L. Verfasser aut Scanning and transmission electron microscopy an introduction Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens New York Freeman 1993 VIII, 225 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier This authoritative volume, ideal for use in any laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available. Elektronenmicroscopie gtt Microscopes électroniques à balayage Microscopes électroniques à transmission Microscopie électronique en transmission ram Microscopie électronique à balayage ram Scanning electron microscopy Transmission electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Heckman, John W. Verfasser aut Klomparens, Karen L. Verfasser aut |
spellingShingle | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. Scanning and transmission electron microscopy an introduction Elektronenmicroscopie gtt Microscopes électroniques à balayage Microscopes électroniques à transmission Microscopie électronique en transmission ram Microscopie électronique à balayage ram Scanning electron microscopy Transmission electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
subject_GND | (DE-588)4014327-2 |
title | Scanning and transmission electron microscopy an introduction |
title_auth | Scanning and transmission electron microscopy an introduction |
title_exact_search | Scanning and transmission electron microscopy an introduction |
title_full | Scanning and transmission electron microscopy an introduction Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
title_fullStr | Scanning and transmission electron microscopy an introduction Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
title_full_unstemmed | Scanning and transmission electron microscopy an introduction Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
title_short | Scanning and transmission electron microscopy |
title_sort | scanning and transmission electron microscopy an introduction |
title_sub | an introduction |
topic | Elektronenmicroscopie gtt Microscopes électroniques à balayage Microscopes électroniques à transmission Microscopie électronique en transmission ram Microscopie électronique à balayage ram Scanning electron microscopy Transmission electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
topic_facet | Elektronenmicroscopie Microscopes électroniques à balayage Microscopes électroniques à transmission Microscopie électronique en transmission Microscopie électronique à balayage Scanning electron microscopy Transmission electron microscopy Elektronenmikroskopie |
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