Gate oxide integrity of BiMOS power devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Mikrofilm Buch |
| Sprache: | English |
| Veröffentlicht: |
1994
|
| Ausgabe: | [Mikrofiche-Ausg.] |
| Schlagworte: | |
| Beschreibung: | Zürich, Techn. Hochsch., Diss., 1994. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x |
| Beschreibung: | III, 121 S. Ill., graph. Darst. |
| ISBN: | 3907574044 |
Internformat
MARC
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| 001 | BV010535076 | ||
| 003 | DE-604 | ||
| 005 | 19970714 | ||
| 007 | he|uuuuuuuuuu | ||
| 008 | 951220s1994 ad|| bm||| 00||| engod | ||
| 020 | |a 3907574044 |9 3-907574-04-4 | ||
| 035 | |a (OCoLC)174312338 | ||
| 035 | |a (DE-599)BVBBV010535076 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-29T | ||
| 084 | |a ELT 357d |2 stub | ||
| 100 | 1 | |a Herr, Egon |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Gate oxide integrity of BiMOS power devices |c presented by Egon Herr |
| 250 | |a [Mikrofiche-Ausg.] | ||
| 264 | 1 | |c 1994 | |
| 300 | |a III, 121 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b h |2 rdamedia | ||
| 338 | |b he |2 rdacarrier | ||
| 500 | |a Zürich, Techn. Hochsch., Diss., 1994. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x | ||
| 650 | 0 | 7 | |a Gate-Oxid |0 (DE-588)4269383-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a BIMOS |0 (DE-588)4260105-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a BIMOS |0 (DE-588)4260105-8 |D s |
| 689 | 0 | 1 | |a Gate-Oxid |0 (DE-588)4269383-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007022380 | ||
Datensatz im Suchindex
| _version_ | 1804125003514380288 |
|---|---|
| any_adam_object | |
| author | Herr, Egon |
| author_facet | Herr, Egon |
| author_role | aut |
| author_sort | Herr, Egon |
| author_variant | e h eh |
| building | Verbundindex |
| bvnumber | BV010535076 |
| classification_tum | ELT 357d |
| ctrlnum | (OCoLC)174312338 (DE-599)BVBBV010535076 |
| discipline | Elektrotechnik |
| edition | [Mikrofiche-Ausg.] |
| format | Microfilm Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV010535076 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:54:39Z |
| institution | BVB |
| isbn | 3907574044 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007022380 |
| oclc_num | 174312338 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T |
| owner_facet | DE-91 DE-BY-TUM DE-29T |
| physical | III, 121 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| record_format | marc |
| spelling | Herr, Egon Verfasser aut Gate oxide integrity of BiMOS power devices presented by Egon Herr [Mikrofiche-Ausg.] 1994 III, 121 S. Ill., graph. Darst. txt rdacontent h rdamedia he rdacarrier Zürich, Techn. Hochsch., Diss., 1994. - Mikrofiche-Ausg.: 2 Mikrofiches : 24x Gate-Oxid (DE-588)4269383-4 gnd rswk-swf BIMOS (DE-588)4260105-8 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content BIMOS (DE-588)4260105-8 s Gate-Oxid (DE-588)4269383-4 s DE-604 |
| spellingShingle | Herr, Egon Gate oxide integrity of BiMOS power devices Gate-Oxid (DE-588)4269383-4 gnd BIMOS (DE-588)4260105-8 gnd |
| subject_GND | (DE-588)4269383-4 (DE-588)4260105-8 (DE-588)4113937-9 |
| title | Gate oxide integrity of BiMOS power devices |
| title_auth | Gate oxide integrity of BiMOS power devices |
| title_exact_search | Gate oxide integrity of BiMOS power devices |
| title_full | Gate oxide integrity of BiMOS power devices presented by Egon Herr |
| title_fullStr | Gate oxide integrity of BiMOS power devices presented by Egon Herr |
| title_full_unstemmed | Gate oxide integrity of BiMOS power devices presented by Egon Herr |
| title_short | Gate oxide integrity of BiMOS power devices |
| title_sort | gate oxide integrity of bimos power devices |
| topic | Gate-Oxid (DE-588)4269383-4 gnd BIMOS (DE-588)4260105-8 gnd |
| topic_facet | Gate-Oxid BIMOS Hochschulschrift |
| work_keys_str_mv | AT herregon gateoxideintegrityofbimospowerdevices |