Adequate test sets for loop testing:
Gespeichert in:
Hauptverfasser: | , , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Haifa, Israel
1992
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Schriftenreihe: | Center for Intelligent Systems <Hêfā>: CIS report
1992,18 |
Beschreibung: | 26 Bl. |
Internformat
MARC
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100 | 1 | |a Rupp, M. Z. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Adequate test sets for loop testing |c by M. Z. Rupp, J. A. Makowsky and I. Pomeranz |
264 | 1 | |a Haifa, Israel |c 1992 | |
300 | |a 26 Bl. | ||
336 | |b txt |2 rdacontent | ||
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490 | 1 | |a Center for Intelligent Systems <Hêfā>: CIS report |v 1992,18 | |
700 | 1 | |a Makowsky, Johann A. |d 1948- |e Verfasser |0 (DE-588)118024507 |4 aut | |
700 | 1 | |a Pomeranz, I. |e Verfasser |4 aut | |
830 | 0 | |a Center for Intelligent Systems <Hêfā>: CIS report |v 1992,18 |w (DE-604)BV010530086 |9 1992,18 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-007020254 |
Datensatz im Suchindex
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any_adam_object | |
author | Rupp, M. Z. Makowsky, Johann A. 1948- Pomeranz, I. |
author_GND | (DE-588)118024507 |
author_facet | Rupp, M. Z. Makowsky, Johann A. 1948- Pomeranz, I. |
author_role | aut aut aut |
author_sort | Rupp, M. Z. |
author_variant | m z r mz mzr j a m ja jam i p ip |
building | Verbundindex |
bvnumber | BV010531571 |
ctrlnum | (OCoLC)254441605 (DE-599)BVBBV010531571 |
format | Book |
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id | DE-604.BV010531571 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T17:54:36Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007020254 |
oclc_num | 254441605 |
open_access_boolean | |
owner | DE-91G DE-BY-TUM |
owner_facet | DE-91G DE-BY-TUM |
physical | 26 Bl. |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
record_format | marc |
series | Center for Intelligent Systems <Hêfā>: CIS report |
series2 | Center for Intelligent Systems <Hêfā>: CIS report |
spelling | Rupp, M. Z. Verfasser aut Adequate test sets for loop testing by M. Z. Rupp, J. A. Makowsky and I. Pomeranz Haifa, Israel 1992 26 Bl. txt rdacontent n rdamedia nc rdacarrier Center for Intelligent Systems <Hêfā>: CIS report 1992,18 Makowsky, Johann A. 1948- Verfasser (DE-588)118024507 aut Pomeranz, I. Verfasser aut Center for Intelligent Systems <Hêfā>: CIS report 1992,18 (DE-604)BV010530086 1992,18 |
spellingShingle | Rupp, M. Z. Makowsky, Johann A. 1948- Pomeranz, I. Adequate test sets for loop testing Center for Intelligent Systems <Hêfā>: CIS report |
title | Adequate test sets for loop testing |
title_auth | Adequate test sets for loop testing |
title_exact_search | Adequate test sets for loop testing |
title_full | Adequate test sets for loop testing by M. Z. Rupp, J. A. Makowsky and I. Pomeranz |
title_fullStr | Adequate test sets for loop testing by M. Z. Rupp, J. A. Makowsky and I. Pomeranz |
title_full_unstemmed | Adequate test sets for loop testing by M. Z. Rupp, J. A. Makowsky and I. Pomeranz |
title_short | Adequate test sets for loop testing |
title_sort | adequate test sets for loop testing |
volume_link | (DE-604)BV010530086 |
work_keys_str_mv | AT ruppmz adequatetestsetsforlooptesting AT makowskyjohanna adequatetestsetsforlooptesting AT pomeranzi adequatetestsetsforlooptesting |