Vector sets for exhaustive testing of logic circuits:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Haifa, Israel
1986
|
| Schriftenreihe: | haṭ- Ṭeḵniyyôn, Māḵôn Ṭeḵnôlôgî le-Yiśrā'ēl <Ḥêfā> / Department of Computer Science: Technical report
396 |
| Beschreibung: | 28 Bl. |
Internformat
MARC
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| 100 | 1 | |a Seroussi, Gadiel |e Verfasser |4 aut | |
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| 264 | 1 | |a Haifa, Israel |c 1986 | |
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| 490 | 1 | |a haṭ- Ṭeḵniyyôn, Māḵôn Ṭeḵnôlôgî le-Yiśrā'ēl <Ḥêfā> / Department of Computer Science: Technical report |v 396 | |
| 700 | 1 | |a Bshouty, Nader H. |e Verfasser |4 aut | |
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Datensatz im Suchindex
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| any_adam_object | |
| author | Seroussi, Gadiel Bshouty, Nader H. |
| author_facet | Seroussi, Gadiel Bshouty, Nader H. |
| author_role | aut aut |
| author_sort | Seroussi, Gadiel |
| author_variant | g s gs n h b nh nhb |
| building | Verbundindex |
| bvnumber | BV010507984 |
| ctrlnum | (OCoLC)633324225 (DE-599)BVBBV010507984 |
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| id | DE-604.BV010507984 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:54:11Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007003700 |
| oclc_num | 633324225 |
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| owner | DE-91G DE-BY-TUM |
| owner_facet | DE-91G DE-BY-TUM |
| physical | 28 Bl. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
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| series2 | haṭ- Ṭeḵniyyôn, Māḵôn Ṭeḵnôlôgî le-Yiśrā'ēl <Ḥêfā> / Department of Computer Science: Technical report |
| spelling | Seroussi, Gadiel Verfasser aut Vector sets for exhaustive testing of logic circuits by G. Seroussi and N. H. Bshouty Haifa, Israel 1986 28 Bl. txt rdacontent n rdamedia nc rdacarrier haṭ- Ṭeḵniyyôn, Māḵôn Ṭeḵnôlôgî le-Yiśrā'ēl <Ḥêfā> / Department of Computer Science: Technical report 396 Bshouty, Nader H. Verfasser aut Department of Computer Science: Technical report <<haṭ->> Ṭeḵniyyôn, Māḵôn Ṭeḵnôlôgî le-Yiśrā'ēl <Ḥêfā> 396 (DE-604)BV010499135 396 |
| spellingShingle | Seroussi, Gadiel Bshouty, Nader H. Vector sets for exhaustive testing of logic circuits |
| title | Vector sets for exhaustive testing of logic circuits |
| title_auth | Vector sets for exhaustive testing of logic circuits |
| title_exact_search | Vector sets for exhaustive testing of logic circuits |
| title_full | Vector sets for exhaustive testing of logic circuits by G. Seroussi and N. H. Bshouty |
| title_fullStr | Vector sets for exhaustive testing of logic circuits by G. Seroussi and N. H. Bshouty |
| title_full_unstemmed | Vector sets for exhaustive testing of logic circuits by G. Seroussi and N. H. Bshouty |
| title_short | Vector sets for exhaustive testing of logic circuits |
| title_sort | vector sets for exhaustive testing of logic circuits |
| volume_link | (DE-604)BV010499135 |
| work_keys_str_mv | AT seroussigadiel vectorsetsforexhaustivetestingoflogiccircuits AT bshoutynaderh vectorsetsforexhaustivetestingoflogiccircuits |