Particle-induced X-ray emission spectrometry (PIXE):
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
New York u.a.
Wiley
1995
|
| Schriftenreihe: | Chemical analysis
133 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXIII, 451 S. graph. Darst. |
| ISBN: | 0471589446 |
Internformat
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| 245 | 1 | 0 | |a Particle-induced X-ray emission spectrometry (PIXE) |c ed. by Sven A. E. Johansson ... |
| 264 | 1 | |a New York u.a. |b Wiley |c 1995 | |
| 300 | |a XXIII, 451 S. |b graph. Darst. | ||
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Datensatz im Suchindex
| _version_ | 1805074215998586880 |
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| adam_text |
PARTICLE-INDUCED X-RAY EMISSION SPECTROMETRY (PIXE) EDITED BY SVEN A. E.
JOHANSSON DEPARTMENT OF NUCLEAR PHYSICS LUND INSTITUTE OF TECHNOLOGY
LUND, SWEDEN JOHN L. CAMPBELL DEPARTMENT OF PHYSICS UNIVERSITY OF GUELPH
GUELPH, ONTARIO, CANADA KLAS G. MALMQVIST DEPARTMENT OF NUCLEAR PHYSICS
LUND INSTITUTE OF TECHNOLOGY LUND, SWEDEN A WILEY-INTERSCIENCE
PUBLICATION JOHN WILEY & SONS, INC. NEW YORK / CHICHESTER / BRISBANE /
TORONTO / SINGAPORE CONTENTS PREFACE CUMULATIVE LISTING OF VOLUMES IN
SERIES XVN XIX CHAPTER 1 INTRODUCTION TO PIXE SVEN A. E. JOHANSSON 1.1.
A BRIEF HISTORY 1.2. BASIC PRINCIPLES REFERENCES 1 7 17 CHAPTER 2
INSTRUMENTATION, FUNDAMENTALS, AND QUANTIFICATION 19 JOHN L. CAMPBELL
2.1. INSTRUMENTATION 19 2.1.1. BEAM PREPARATION 19 2.1.2.
INSTRUMENTATION OF SPECIMEN CHAMBER 24 2.1.3. MEASUREMENT OF BEAM
CURRENT AND INTEGRATED CHARGE 27 2.2. SPECIMENS 29 2.3. X-RAY PRODUCTION
PROCESSES 33 2.3.1. CHARACTERISTIC X-RAYS 33 2.3.2. CONTINUOUS
BACKGROUND 35 2.3.3. ELECTRON BREMSSTRAHLUNG 36 2.3.4. GAMMA-RAY
BACKGROUND 40 2.4. X-RAY SPECTROSCOPY 43 2.4.1. CHOICE OF SPECTROMETER
43 2.4.2. SI (LI) DETECTOR CALIBRATION 44 2.4.3. DETECTOR LINESHAPE AND
ESCAPE PEAKS 44 2.4.4. PILE-UP DISTORTION OF SPECTRUM 49 IX X CONTENTS
2.4.5. DETECTION EFFICIENCY 49 2.4.6. X-RAY ABSORBERS 51 2.4.7. COMPUTER
MODELLING OF PIXE SPECTRA 55 2.5. QUANTITATIVE ANALYSIS: STANDARDIZATION
55 2.5.1. RELATIONSHIP BETWEEN X-RAY INTENSITIES AND CONCENTRATIONS 55
2.5.2. ANALYSIS OF THIN SPECIMENS: THIN-TARGET SENSITIVITY CURVES 58
2.5.3. ANALYSIS OF MAJOR AND MINOR ELEMENTS IN THICK SPECIMENS 61 2.5.4.
THICK-TARGET SENSITIVITY CURVES 63 2.5.5. ANALYSIS OF TRACE ELEMENTS IN
THICK SPECIMENS 65 2.5.6. TRACE-ELEMENT ANALYSIS IN SPECIMENS OF
INTERMEDIATE THICKNESS 66 2.5.7. FILM THICKNESS MEASUREMENT AND ANALYSIS
OF MULTIPLE-LAYER SPECIMENS 68 2.5.8. DATA BASE AND ITS ACCURACY 70 2.6.
EXTRACTION OF X-RAY INTENSITIES FROM PIXE SPECTRA 74 2.6.1.
LEAST-SQUARES FITTING AND MODEL X-RAY SPECTRUM 74 2.6.2. CONTINUOUS
BACKGROUND 76 2.6.3. WEIGHTING OF DIFFERENCES 79 2.6.4. DYNAMIC ANALYSIS
METHOD 79 2.6.5. SOFTWARE PACKAGES 80 2.7. ACCURACY OF PIXE ANALYSIS 81
2.8. LIMITS OF DETECTION 89 2.9. PROJECTILES OTHER THAN PROTONS 92
REFERENCES 94 CHAPTER 3 THE HIGH-ENERGY ION MICROPROBE 101 FRANK WATT
AND GEOFF W. GRIME 3.1. INTRODUCTION 101 3.2. HIGH-ENERGY ION MICROBEAM
TECHNIQUES 103 3.2.1. PARTICLE-INDUCED X-RAY EMISSION 104 3.2.2.
RUTHERFORD BACKSCATTERING SPECTROMETRY 104 CONTENTS XI 3.2.3. NUCLEAR
REACTION ANALYSIS 104 3.2.4. SCANNING TRANSMISSION ION MICROSCOPY 108
3.2.5. ION MICROTOMOGRAPHY 109 3.2.6. IONOLUMINESCENCE 110 3.2.7.
SECONDARY ELECTRON IMAGING 110 3.3. MICROBEAM TECHNOLOGY 111 3.3.1.
PROBE-FORMING SYSTEMS 111 3.3.2. TARGET CHAMBERS AND DETECTORS 117
3.3.3. DATA ACQUISITION AND ANALYSIS 122 3.3.4. PRACTICAL HINTS ON HOW
TO ACHIEVE SMALL SPOT SIZES 125 3.3.4.1. BEAM BROADENING DUE TO LENS
ABERRATIONS 126 3.3.4.2. BEAM BROADENING DUE TO EXTERNAL SOURCES 128
3.3.5. SYSTEM PERFORMANCE 133 3.4. MICROBEAM APPLICATIONS 133 3.4.1.
BIOMEDICINE 134 3.4.2. ENVIRONMENTAL RESEARCH 145 3.4.3. MATERIALS
SCIENCE 151 3.4.4. ART AND ARCHAEOLOGY 153 3.4.5. EARTH SCIENCES 156
3.5. CONCLUDING REMARKS 160 REFERENCES 161 CHAPTER 4 BIOLOGICAL AND
MEDICAL APPLICATIONS 16 7 KLAS G. MALMQVIST 4.1. INTRODUCTION 167 4.1.1.
BIOMEDICINE 168 4.2. SAMPLING 170 4.2.1. SAMPLE SIZE EFFECTS 172 4.3.
SAMPLE PREPARATION 172 4.3.1. MACRO-PIXE 172 4.3.1.1. DRYING 174
4.3.1.2. ELIMINATION OF ORGANIC MATRIX 175 XLL CONTENTS 4.3.1.3. TARGET
PREPARATION 176 4.3.1.4. SPECIAL SAMPLE PREPARATION TECHNIQUES 177
4.3.2. MICRO-PIXE 179 4.3.2.1. CRYOPREPARATION 180 4.4. IRRADIATION OF
SPECIMENS 180 4.5. COMBINATION WITH OTHER METHODS 183 4.6. EVALUATION OF
DATA 185 4.7. APPLICATIONS 186 4.7.1. MACRO-PIXE 186 4.7.1.1. MEDICINE
187 4.7.1.2. ZOOLOGY 210 4.7.1.3. BOTANY 211 4.7.1.4. ENVIRONMENT 212
4.7.2. MICRO-PIXE 214 4.7.2.1. MEDICINE 214 4.7.2.2. ZOOLOGY 225
4.7.2.3. BOTANY 226 4.7.2.4. LIMNOLOGY 228 4.8. CONCLUDING REMARKS 228
REFERENCES 230 CHAPTER 5 COMPOSITIONAL ANALYSIS OF ATMOSPHERIC AEROSOLS
237 THOMAS A. CAHILL 5.1. INTRODUCTION 237 5.2. NATURE OF ATMOSPHERIC
AEROSOLS 239 5.3. EARLY EFFORTS IN PIXE ANALYSIS OF AEROSOLS 243 5.4.
COLLECTION OF ATMOSPHERIC AEROSOLS 245 5.4.1. SETTLING OR DRY DEPOSITION
246 5.4.2. FILTRATION 246 5.4.3. OPTIMIZING AEROSOL SAMPLING PROTOCOLS
249 5.4.4. IMPACTION 251 5.5. PIXE ANALYSIS OF ATMOSPHERIC AEROSOLS 254
5.5.1. PIXE ANALYSIS MATCHED TO AEROSOL SAMPLES 255 CONTENTS XLLL 5.5.2.
INTERPRETATION OF PIXE AEROSOL DATA 260 5.5.3. QUALITY ASSURANCE OF PIXE
DATA 263 5.6. THE ESSENTIAL TRANSFORMATION: PIXE LABORATORY DOING
AEROSOLS VERSUS AEROSOL LABORATORY DOING PIXE 265 5.6.1. COMPLEMENTARY
ANALYTICAL METHODS TO PIXE 266 5.6.1.1. MASS 266 5.6.1.2. FORWARD
ALPHA-SCATTERING TECHNIQUE 267 5.6.1.3. PROTON ELASTIC SCATTERING
ANALYSIS 268 5.6.2. OTHER COMPLEMENTARY TECHNIQUES 273 5.7. ATMOSPHERIC
OPTICS, VISIBILITY, AND GLOBAL CLIMATE 274 5.7.1. CONCEPTUAL FRAMEWORK
FOR VISIBILITY RESEARCH 275 5.7.2. SAMPLING AND ANALYSIS OF CAUSAL
AEROSOLS 277 5.7.3. SAMPLING AND ANALYSIS OF TRACER AEROSOLS 5.7.4.
IMPROVE PROTOCOL 5.8. FUTURE POSSIBILITIES 5.8.1. PIXE AND HIGHLY SIZE
RESOLVED SAMPLES 5.8.2. PIXE AND PORTABLE SAMPLERS 5.8.3. PIXE AND GAS
ANALYSIS 5.8.4. PIXE MICROPROBE AND AEROSOL RESEARCH 5.8.5. PIXE AND
GLOBAL CLIMATE REFERENCES 278 279 301 301 304 306 307 307 308 CHAPTER 6
APPLICATIONS IN EARTH SCIENCES 313 JOHN L. CAMPBELL 6.1. INTRODUCTION
313 6.2. SAMPLING OF GEOLOGICAL MATERIAL 314 6.2.1. BULK MATERIAL:
MACRO-PIXE ANALYSIS 314 XIV CONTENTS 6.2.2. INDIVIDUAL GRAINS AND
CRYSTALLITES: MICRO-PIXE ANALYSIS 317 6.3. PRACTICAL ASPECTS OF ANALYSIS
317 6.3.1. SPECIMENS AND SPECIMEN CHAMBER 317 6.3.2. DYNAMIC RANGE OF
PIXE SPECTRA 319 6.3.3. ROLE OF MATRIX IN TRACE-ELEMENT ANALYSIS 323
6.3.4. LIMITS OF DETECTION: PRECISION AND ACCURACY 326 6.4. APPLICATIONS
329 6.4.1. OVERVIEW 329 6.4.2. EXTRATERRESTRIAL MATERIAL 330 6.4.3.
MINERALOGY AND PETROLOGY OF MASSIVE SULFIDE ORE DEPOSITES 337 6.4.4.
IGNEOUS PETROLOGY AND MINERALOGY 343 6.4.5. CHEMICAL ZONING STUDIES 349
6.4.6. FLUID INCLUSIONS 354 6.4.7. VARIOUS APPLICATIONS 355 6.5.
ANCILLARY TECHNIQUES 360 REFERENCES 362 CHAPTER 7 APPLICATIONS IN ART
AND ARCHAEOLOGY 367 KLAS G. MALMQVIST 7.1. INTRODUCTION 367 7.2. GENERAL
ANALYTICAL PROBLEMS 370 7.2.1. MATERIAL PROPERTIES 370 7.2.2. EXTERNAL
BEAM 372 7.2.3. MICROBEAMS 373 7.3. APPLICATIONS 375 7.3.1. STONE
MATERIAL AND GERN STONES 376 7.3.1.1. GERN STONES - 376 7.3.1.2.
OBSIDIANS 377 7.3.1.3. SURFACE CHARACTERIZATION 378 7.3.2. POTTERY AND
RELATED MATERIALS 381 7.3.3. GLASS 384 CONTENTS XV 7.3.4. METALS 389
7.3.4.1. BRONZE 389 7.3.4.2. COPPER AND COPPER ALLOYS 392 7.3.4.3. TIN
394 7.3.4.4. IRON 394 7.3.4.5. NOBLE METALS 395 7.3.5. OSTEOLOGY 398
7.3.6. "PAPERLIKE" MATERIALS 401 7.3.6.1. EXPERIMENTAL ARRANGEMENT 401
7.3.6.2. INKS AND PRINTING TECHNIQUES 403 7.3.6.3. LETTER IDENTIFICATION
405 7.3.6.4. STAMPS 406 7.3.7. PIGMENTS AND PAINTINGS 407 7.4.
CONCLUSIONS 412 REFERENCES 412 CHAPTER 8 COMPARISON WITH OTHER METHODS:
FUTURE PROSPECTS 419 SVEN A. E. JOHANSSON AND JOHN L. CAMPBELL
REFERENCES 433 INDEX 435 |
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| indexdate | 2024-07-20T05:21:58Z |
| institution | BVB |
| isbn | 0471589446 |
| language | Undetermined |
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| physical | XXIII, 451 S. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Wiley |
| record_format | marc |
| series | Chemical analysis |
| series2 | Chemical analysis |
| spelling | Particle-induced X-ray emission spectrometry (PIXE) ed. by Sven A. E. Johansson ... New York u.a. Wiley 1995 XXIII, 451 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Chemical analysis 133 PIXE (DE-588)4174769-0 gnd rswk-swf PIXE (DE-588)4174769-0 s DE-604 Johansson, Sven-Åke 1943- Sonstige (DE-588)122027515 oth Chemical analysis 133 (DE-604)BV000008780 133 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006995946&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Particle-induced X-ray emission spectrometry (PIXE) Chemical analysis PIXE (DE-588)4174769-0 gnd |
| subject_GND | (DE-588)4174769-0 |
| title | Particle-induced X-ray emission spectrometry (PIXE) |
| title_auth | Particle-induced X-ray emission spectrometry (PIXE) |
| title_exact_search | Particle-induced X-ray emission spectrometry (PIXE) |
| title_full | Particle-induced X-ray emission spectrometry (PIXE) ed. by Sven A. E. Johansson ... |
| title_fullStr | Particle-induced X-ray emission spectrometry (PIXE) ed. by Sven A. E. Johansson ... |
| title_full_unstemmed | Particle-induced X-ray emission spectrometry (PIXE) ed. by Sven A. E. Johansson ... |
| title_short | Particle-induced X-ray emission spectrometry (PIXE) |
| title_sort | particle induced x ray emission spectrometry pixe |
| topic | PIXE (DE-588)4174769-0 gnd |
| topic_facet | PIXE |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006995946&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000008780 |
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