Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium: February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Piscataway, NJ
IEEE Service Center
1993
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| Subjects: | |
| Physical Description: | X, 214 S. Ill., graph. Darst. |
| ISBN: | 0780308638 0780308646 |
Staff View
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| spelling | Institute of Electrical and Electronics Engineers Verfasser (DE-588)1692-5 aut Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA general chairman: Robert Simons 1993 IEEE 9th Annual Semiconductor Thermal Measurement & Management Symposium Piscataway, NJ IEEE Service Center 1993 X, 214 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier AMORPHOUS SEMICONDUCTORS nasat CONDUCTIVE HEAT TRANSFER nasat CONFERENCES nasat INTEGRATED CIRCUITS nasat SEMICONDUCTORS (MATERIALS) nasat THERMODYNAMIC PROPERTIES nasat Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Messung (DE-588)4038852-9 gnd rswk-swf Thermische Belastung (DE-588)4059816-0 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1993 Austin Tex. gnd-content Halbleiterbauelement (DE-588)4113826-0 s Thermische Belastung (DE-588)4059816-0 s Messung (DE-588)4038852-9 s DE-604 Simons, Robert Sonstige oth |
| spellingShingle | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA AMORPHOUS SEMICONDUCTORS nasat CONDUCTIVE HEAT TRANSFER nasat CONFERENCES nasat INTEGRATED CIRCUITS nasat SEMICONDUCTORS (MATERIALS) nasat THERMODYNAMIC PROPERTIES nasat Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Messung (DE-588)4038852-9 gnd Thermische Belastung (DE-588)4059816-0 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4038852-9 (DE-588)4059816-0 (DE-588)4113826-0 (DE-588)1071861417 |
| title | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA |
| title_alt | 1993 IEEE 9th Annual Semiconductor Thermal Measurement & Management Symposium |
| title_auth | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA |
| title_exact_search | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA |
| title_full | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA general chairman: Robert Simons |
| title_fullStr | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA general chairman: Robert Simons |
| title_full_unstemmed | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA general chairman: Robert Simons |
| title_short | Ninth annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| title_sort | ninth annual ieee semiconductor thermal measurement and management symposium february 2 4 1993 four seasons hotel austin tx usa |
| title_sub | February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA |
| topic | AMORPHOUS SEMICONDUCTORS nasat CONDUCTIVE HEAT TRANSFER nasat CONFERENCES nasat INTEGRATED CIRCUITS nasat SEMICONDUCTORS (MATERIALS) nasat THERMODYNAMIC PROPERTIES nasat Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Messung (DE-588)4038852-9 gnd Thermische Belastung (DE-588)4059816-0 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | AMORPHOUS SEMICONDUCTORS CONDUCTIVE HEAT TRANSFER CONFERENCES INTEGRATED CIRCUITS SEMICONDUCTORS (MATERIALS) THERMODYNAMIC PROPERTIES Semiconductors Cooling Congresses Semiconductors Thermal properties Congresses Messung Thermische Belastung Halbleiterbauelement Konferenzschrift 1993 Austin Tex. |
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