Modeling of electrical overstress in integrated circuits:
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Boston u.a.
Kluwer
1995
|
Schriftenreihe: | The Kluwer international series in engineering and computer science
289 |
Schlagworte: | |
Beschreibung: | XXIII, 148 S. Ill., graph. Darst. |
ISBN: | 0792395050 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV010492228 | ||
003 | DE-604 | ||
005 | 19960301 | ||
007 | t | ||
008 | 951123s1995 ad|| |||| 00||| eng d | ||
020 | |a 0792395050 |9 0-7923-9505-0 | ||
035 | |a (OCoLC)832437671 | ||
035 | |a (DE-599)BVBBV010492228 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-91 |a DE-706 | ||
050 | 0 | |a TK7874 | |
082 | 0 | |a 621.3815 | |
084 | |a ELT 364f |2 stub | ||
100 | 1 | |a Díaz, Carlos H. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Modeling of electrical overstress in integrated circuits |c Carlos H. Díaz ; Sung-Mo (Steve) Kang ; Charvaka Duvvury |
264 | 1 | |a Boston u.a. |b Kluwer |c 1995 | |
300 | |a XXIII, 148 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a The Kluwer international series in engineering and computer science |v 289 | |
650 | 4 | |a Electric discharges |x Computer simulation | |
650 | 4 | |a Integrated circuits |x Protection |x Computer simulation | |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektrostatische Entladung |0 (DE-588)4401020-5 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | 1 | |a Elektrostatische Entladung |0 (DE-588)4401020-5 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Kang, Sung-Mo |e Verfasser |4 aut | |
700 | 1 | |a Duvvury, Charvaka |e Verfasser |4 aut | |
830 | 0 | |a The Kluwer international series in engineering and computer science |v 289 |w (DE-604)BV023545171 |9 289 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-006991282 |
Datensatz im Suchindex
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any_adam_object | |
author | Díaz, Carlos H. Kang, Sung-Mo Duvvury, Charvaka |
author_facet | Díaz, Carlos H. Kang, Sung-Mo Duvvury, Charvaka |
author_role | aut aut aut |
author_sort | Díaz, Carlos H. |
author_variant | c h d ch chd s m k smk c d cd |
building | Verbundindex |
bvnumber | BV010492228 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_tum | ELT 364f |
ctrlnum | (OCoLC)832437671 (DE-599)BVBBV010492228 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV010492228 |
illustrated | Illustrated |
indexdate | 2024-07-09T17:53:24Z |
institution | BVB |
isbn | 0792395050 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006991282 |
oclc_num | 832437671 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-706 |
owner_facet | DE-91 DE-BY-TUM DE-706 |
physical | XXIII, 148 S. Ill., graph. Darst. |
publishDate | 1995 |
publishDateSearch | 1995 |
publishDateSort | 1995 |
publisher | Kluwer |
record_format | marc |
series | The Kluwer international series in engineering and computer science |
series2 | The Kluwer international series in engineering and computer science |
spelling | Díaz, Carlos H. Verfasser aut Modeling of electrical overstress in integrated circuits Carlos H. Díaz ; Sung-Mo (Steve) Kang ; Charvaka Duvvury Boston u.a. Kluwer 1995 XXIII, 148 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Kluwer international series in engineering and computer science 289 Electric discharges Computer simulation Integrated circuits Protection Computer simulation Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Elektrostatische Entladung (DE-588)4401020-5 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Elektrostatische Entladung (DE-588)4401020-5 s DE-604 Kang, Sung-Mo Verfasser aut Duvvury, Charvaka Verfasser aut The Kluwer international series in engineering and computer science 289 (DE-604)BV023545171 289 |
spellingShingle | Díaz, Carlos H. Kang, Sung-Mo Duvvury, Charvaka Modeling of electrical overstress in integrated circuits The Kluwer international series in engineering and computer science Electric discharges Computer simulation Integrated circuits Protection Computer simulation Integrierte Schaltung (DE-588)4027242-4 gnd Elektrostatische Entladung (DE-588)4401020-5 gnd |
subject_GND | (DE-588)4027242-4 (DE-588)4401020-5 |
title | Modeling of electrical overstress in integrated circuits |
title_auth | Modeling of electrical overstress in integrated circuits |
title_exact_search | Modeling of electrical overstress in integrated circuits |
title_full | Modeling of electrical overstress in integrated circuits Carlos H. Díaz ; Sung-Mo (Steve) Kang ; Charvaka Duvvury |
title_fullStr | Modeling of electrical overstress in integrated circuits Carlos H. Díaz ; Sung-Mo (Steve) Kang ; Charvaka Duvvury |
title_full_unstemmed | Modeling of electrical overstress in integrated circuits Carlos H. Díaz ; Sung-Mo (Steve) Kang ; Charvaka Duvvury |
title_short | Modeling of electrical overstress in integrated circuits |
title_sort | modeling of electrical overstress in integrated circuits |
topic | Electric discharges Computer simulation Integrated circuits Protection Computer simulation Integrierte Schaltung (DE-588)4027242-4 gnd Elektrostatische Entladung (DE-588)4401020-5 gnd |
topic_facet | Electric discharges Computer simulation Integrated circuits Protection Computer simulation Integrierte Schaltung Elektrostatische Entladung |
volume_link | (DE-604)BV023545171 |
work_keys_str_mv | AT diazcarlosh modelingofelectricaloverstressinintegratedcircuits AT kangsungmo modelingofelectricaloverstressinintegratedcircuits AT duvvurycharvaka modelingofelectricaloverstressinintegratedcircuits |