Surface analysis with STM and AFM: experimental and theoretical aspects of image analysis
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Weinheim [u.a.]
VCH
1996
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XII, 323 S. Ill., graph. Darst. |
| ISBN: | 3527293132 |
Internformat
MARC
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| 100 | 1 | |a Magonov, Sergei N. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Surface analysis with STM and AFM |b experimental and theoretical aspects of image analysis |c Sergei N. Magonov ; Myung-Hwan Whangbo |
| 264 | 1 | |a Weinheim [u.a.] |b VCH |c 1996 | |
| 300 | |a XII, 323 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
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| 650 | 7 | |a Oppervlakken |2 gtt | |
| 650 | 7 | |a Scanning tunneling microscopy |2 gtt | |
| 650 | 4 | |a Atomic force microscopy | |
| 650 | 4 | |a Electric insulators and insulation |x Testing | |
| 650 | 4 | |a Metals |x Surfaces |x Analysis | |
| 650 | 4 | |a Scanning tunneling microscopy | |
| 650 | 4 | |a Semiconductors |x Testing | |
| 650 | 4 | |a Surfaces (Technology) |x Analysis | |
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| 700 | 1 | |a Whangbo, Myung-Hwan |e Verfasser |4 aut | |
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Datensatz im Suchindex
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|---|---|
| adam_text | SERGEI N. MAGONOV, MYUNG-HWAN WHANGBO SURFACE ANALYSIS WITH STM AND AFM
EXPERIMENTAL AND THEORETICAL ASPECTS OF IMAGE ANALYSIS VCH WEINHEIM *
NEW YORK * BASEL * CAMBRIDGE * TOKYO CONTENTS PREFACE V 1 INTRODUCTION 1
1.1 DEVELOPMENT OF SCANNING PROBE MICROSCOPY 1 1.2 KEY PROBLEMS OF STM
AND AFM APPLICATIONS 2 1.2.1 IMAGE INTERPRETATION 2 1.2.2 TIP-SAMPLE
INTERACTIONS 4 1.2.3 SURFACE RELAXATION AND LOCAL HARDNESS 5 1.2.4
SURFACE FORCES AND AFM 6 1.3 OBJECTIVES 7 REFERENCES 7 2 PHYSICAL
PHENOMENA RELEVANT TO STM AND AFM 9 2.1 ELECTRON TRANSPORT PROCESSES 9
2.1.1 CONVENTIONAL ELECTRON TUNNELING REGIME 10 2.1.2 ELECTRONIC AND
MECHANICAL CONTACT REGIMES 10 2.1.3 STM IN DIFFERENT ENVIRONMENTS 11 2.2
SURVEY OF FORCE INTERACTIONS 11 2.2.1 FORCE-VS.-DISTANCE CURVES 12 2.2.2
SHORT-RANGE FORCES AND SAMPLE DEFORMATION 13 2.2.3 LONG-RANGE AND OTHER
FORCES 16 2.2.3.1 LONG-RANGE FORCES 16 2.2.3.2 ADHESION AND CAPILLARY
FORCES 18 REFERENCES 18 3 SCANNING PROBE MICROSCOPES 21 3.1 OPERATING
PRINCIPLES AND MAIN COMPONENTS 2 2 3.1.1 SCANNER 23 3.1.2 TIP-SAMPLE
APPROACH AND ELECTRONIC FEEDBACK 23 3.1.3 SCANNING MODES AND PARAMETERS
24 3.1.4 IMAGES AND FILTERING 25 3.1.5 ISOLATION OF VIBRATIONAL NOISE 27
3.2 SCANNING TUNNELING MICROSCOPE 27 3.2.1 STM TIPS AND CURRENT
DETECTION 27 3.2.2 BIAS VOLTAGE 28 3.2.3 SCANNING TUNNELING SPECTROSCOPY
30 CONTENTS 3.3 ATOMIC FORCE MICROSCOPE 31 3.3.1 CONTACT MODE AND FORCE
DETECTION 33 3.3.2 AFM PROBES 35 3.3.3 DYNAMIC AFM MEASUREMENTS 37
3.3.3.1 AFM OPERATION IN THE ATTRACTIVE FORCE REGIME 38 3.3.3.2 TAPPING
MODE 39 3.3.3.3 FORCE-MODULATION TECHNIQUES 39 3.3.3.4 MAGNETIC FORCE
MICROSCOPY 39 3.4 STM AND AFM AS METROLOGY TOOLS 40 3.4.1 RESOLUTION IN
STM AND AFM 40 3.4.2 METROLOGICAL APPLICATIONS 43 REFERENCES 44 4
PRACTICAL ASPECTS OF STM AND AFM MEASUREMENTS 47 4.1 SAMPLES 47 4.2
OPTIMIZATION OF EXPERIMENTS 48 4.2.1 OPTIMIZATION OF STM EXPERIMENTS 48
4.2.2 OPTIMIZATION OF CONTACT-MODE AFM EXPERIMENTS 50 4.2.3 OPTIMIZATION
OF TAPPING-MODE AFM EXPERIMENTS 53 4.3 STM AND AFM MEASUREMENTS 55 4.3.1
LARGE-SCALE IMAGING 55 4.3.2 ATOMIC-SCALE IMAGING 57 4.3.3 IMAGE
ARTIFACTS 58 REFERENCES 62 5 SIMULATIONS OF STM AND AFM IMAGES 65 5.1
ELECTRONIC STRUCTURES OF SOLIDS 65 5.2 THEORETICAL ASPECTS OF STM 68
5.2.1 TUNNELING BETWEEN METALS 68 5.2.2 TUNNELING BETWEEN METAL AND
SEMICONDUCTOR 69 5.2.3 TERSOFF-HAMMAN THEORY AND ITS EXTENSION 72 5.2.4
OTHER THEORIES 73 5.3 THEORETICAL ASPECTS OF AFM 74 5.4 IMAGE SIMULATION
BY DENSITY PLOT CALCULATIONS 74 5.4.1 STM IMAGE SIMULATION 74 5.4.2 AFM
IMAGE SIMULATION 76 5.4.3 STM AND AFM IMAGES OF GRAPHITE 77 REFERENCES
80 6 STM AND AFM IMAGES OF LAYERED INORGANIC COMPOUNDS . . . 83 6.1
LAYERS FROM MX 6 TRIGONAL PRISMS AND OCTAHEDRA 83 CONTENTS IX 6.2 IMAGES
OF LAYERED COMPOUNDS 86 6.2.1 2H-MOS 2 86 6.2.2 MOOCL 2 88 6.2.3 WTE 2
89 6.2.4 NBTE 2 92 6.2.5 SS-NB 3 I 8 94 6.2.6 LT-TASE 2 98 6.3 CHARGE
DENSITY WAVES OF MC G (M = K, RB, CS) 105 6.3.1 OBSERVATIONS 105 6.3.2
ORIGIN OF NONUNIFORM CHARGE DISTRIBUTION 107 6.4 CONCLUDING REMARKS 109
REFERENCES 110 7 STM IMAGES ASSOCIATED WITH POINT DEFECTS OF LAYERED
INORGANIC COMPOUNDS 113 7.1 IMPERFECTIONS IN COMPOUNDS WITH METAL
CLUSTERS 113 7.2 POINT DEFECTS IN SEMICONDUCTOR 2H-MOS 2 116 7.3 CASES
TRACTABLE BY ELECTRONIC BAND STRUCTURE CALCULATIONS . . . 118 7.3.1
LIGAND-ATOM VACANCY 119 7.3.2 METAL-ATOM VACANCY 120 7.3.3 DONOR
SUBSTITUTION AT THE METAL SITE 120 7.4 CASES INTRACTABLE BY ELECTRONIC
BAND STRUCTURE CALCULATIONS . . 123 7.4.1 DONOR SUBSTITUTION AT THE
LIGAND SITE 123 7.4.1.1 THE CASE OF NEGATIVE BIAS 124 7.4.1.2 THE CASE
OF POSITIVE BIAS 125 7.4.2 ACCEPTOR SUBSTITUTION AT THE LIGAND SITE 125
7.4.2.1 THE CASE OF POSITIVE BIAS . 126 7.4.2.2 THE CASE OF NEGATIVE
BIAS 127 7.4.3 ACCEPTOR SUBSTITUTION AT THE METAL SITE 127 7.5 SURVEY OF
IMAGE IMPERFECTIONS OBSERVED FOR D 2 2H-MX 2 SYSTEMS 128 7.5.1
ATOMIC-SCALE IMAGES 129 7.5.2 NANOMETER-SCALE IMAGES 131 7.6 CONCLUDING
REMARKS 133 REFERENCES 134 8 TIP-SAMPLE INTERACTIONS 135 8.1 ELECTRONIC
INTERACTIONS IN STM 13 5 8.1.1 TIP ELECTRONIC STATES 135 8.1.2
TIP-INDUCED LOCAL STATES 136 8.2 FORCE INTERACTIONS IN STM 137 8.2.1
FORCE INTERACTIONS IN AMBIENT CONDITIONS 138 8.2.2 FORCE INTERACTIONS IN
ULTRA HIGH VACUUM (UHV) 140 X CONTENTS 8.3 TIP-SAMPLE INTERACTIONS IN
AFM 145 8.3.1 FORCE INTERACTIONS ON THE ATOMIC SCALE 145 8.3.2 SURFACE
DEFORMATION 146 8.4 CONCLUDING REMARKS 148 REFERENCES 148 9 SURFACE
RELAXATION IN STM AND AFM IMAGES 151 9.1 TIP FORCE INDUCED DEFORMATION
IN HOPG 151 9.1.1 THREE-FOR-HEXAGON PATTERN OF HOPG 151 9.1.2 HEXAGONAL
MOIRE PATTERNS IN STM IMAGES 154 9.2 WAGON-WHEEL PATTERNS OF MOSE 2
EPILAYERS ON MOS 2 157 9.3 STM AND AFM IMAGES OF A-RUCL 3 AND A-MOCL 3
159 9.3.1 IMAGES OF A-RUCL 3 AT LOW APPLIED FORCE 160 9.3.2 IMAGES OF
A-RUCL 3 AT HIGH APPLIED FORCE 163 9.3.3 TIP FORCE INDUCED SURFACE
DEFORMATION IN A-RUCL 3 163 9.3.4 AFM IMAGES OF A-MOCL 3 167 9.4 LAYERED
TRANSITION-METAL TELLURIDES MA^TE 2 169 9.4.1 ATOMIC-SCALE DEFORMATION
IN THE COMMENSURATE TELLURIDES . . . 169 9.4.2 STRUCTURE OF
INCOMMENSURATE TELLURIDE TAGE 0355 TE 2 176 9.5 TIP FORCE INDUCED
CHANGES IN AFM IMAGES OF NBTE 2 177 9.6 NANOSCALE RING STRUCTURE OF MOS
2 AND WSE 2 180 9.7 CONCLUDING REMARKS 184 REFERENCES 185 10 ORGANIC
CONDUCTING SALTS 189 10.1 CRYSTAL AND ELECTRONIC STRUCTURES 189 10.2
EARLY STM STUDIES OF ORGANIC CONDUCTORS 193 10.3 STM AND AFM IMAGING OF
ORGANIC CONDUCTORS 194 10.3.1 SURFACE PROCESSES DURING IMAGING 194
10.3.2 MOLECULAR-SCALE IMAGES 196 10.4 ANALYSIS OF THE IMAGES OF TCNQ
SALTS 199 10.4.1 TTF-TCNQ 199 10.4.2 QN(TCNQ) 2 201 10.4.3 4EP(TCNQ) 2
202 10.4.4 TEA(TCNQ) 2 204 10.4.5 TCNQ SALTS WITH SUBSTITUTED
PHENYLPYRIDINES 205 10.5 ANALYSIS OF THE IMAGES OF BEDT-TTF SALTS 206
10.5.1 CATION-LAYER IMAGES OF A-PHASES 206 10.5.2 HOMO DENSITY OF
SS-(BEDT-TTF) 2 I 3 209 10.5.3 CATION-LAYER IMAGES OF K-PHASES 212 10.5.4
ANION-LAYER IMAGES OF K-PHASES 212 CONTENTS XI 10.6 CONCLUDING REMARKS
216 REFERENCES 217 11 ORGANIC ADSORBATES AT LIQUID/SOLID INTERFACES 219
11.1 STM OF ORGANIC ADSORBATES 219 11.1.1 ORGANIC COMPOUNDS AND
SUBSTRATES 219 11.1.2 STM IMAGING AT LIQUID/SOLID INTERFACES 221 11.2
STM OF NORMAL AND CYCLIC ALKANE LAYERS 223 11.2.1 IMAGES OF NORMAL
ALKANES ON HOPG 223 11.2.2 MOLECULAR ORDER OF CYCLOALKANE ADSORBATES ON
HOPG . . . . 228 11.3 INFLUENCE OF SUBSTRATE ON ADSORBATE STRUCTURE 233
11.3.1 MOLECULAR-SCALE IMAGES OF NORMAL ALKANES ON SS-NB 3 I 8 . . . .
233 11.3.2 4-ALKYL-4 -CYANOBIPHENYLS ON HOPG 235 11.3.3
4-ALKYL-4 -CYANOBIPHENYLS ON SS-NB 3 I 8 237 11.4 CONCLUDING REMARKS 241
REFERENCES 241 12 SELF-ASSEMBLED STRUCTURES 243 12.1 SCANNING PROBE
MICROSCOPY STUDIES OF THIN ORGANIC FILMS . . 243 12.1.1 MORPHOLOGY AND
MOLECULAR ORDER 243 12.1.2 NANOMECHANICAL PROPERTIES 244 12.2
SELF-ORGANIZATION OF AMPHIPHILES 245 12.2.1 BASIC PRINCIPLES 245 12.2.2
SAMPLE PREPARATION AND AFM IMAGING 246 12.3 AFM STUDY OF
7V-(N-ALKYI)-D-GLUCONAMIDES 250 12.3.1 CRYSTAL STRUCTURES 250 12.3.2
LAYERS WITH CRYSTAL-LIKE ORDER 253 12.3.2.1 THIN OVERLAYERS 253 12.3.2.2
DOUBLE LAYERS 255 12.3.3 SUPRAMOLECULAR ASSEMBLIES 257 12.3.3.1 MICELLAR
STRUCTURES 257 12.3.3.2 FIBER-LIKE ASSEMBLIES 259 12.3.3.3 ROD-LIKE
ASSEMBLIES 261 12.3.4 STRUCTURAL MODELS 264 12.4 AFM STUDY OF
AHN-ALKYO-A^ -D-MALTOSYLSEMICARBAZONES . . . . 266 12.4.1 SELF-ASSEMBLED
STRUCTURES OF 10MS 266 12.4.2 SELF-ASSEMBLED STRUCTURES OF 16MS 269
12.4.3 STRUCTURAL MODELS 273 12.5 CONCLUDING REMARKS 274 REFERENCES 275
XII CONTENTS 13 POLYMERS 277 13.1 GENERAL CONSIDERATIONS 277 13.1.1
POLYMER STRUCTURE 277 13.1.2 ANALYSIS OF POLYMER SURFACES 279 13.1.3
APPLYING STM AND AFM 279 13.2 STM OF POLYMER SAMPLES 281 13.2.1
CONDUCTING POLYMERS 281 13.2.2 METAL-COATED POLYMER SURFACES 282 13.2.3
POLYMER LAYERS ON CONDUCTING SUBSTRATES 283 13.3 AFM OF POLYMER CRYSTAL
SURFACES 284 13.3.1 POLYDIACETYLENE SINGLE CRYSTAL 284 13.3.2
POLYETHYLENE SINGLE CRYSTAL 286 13.3.3 POLYMER SPHERULITES 291 13.4 AFM
OF ORIENTED POLYMERS 294 13.4.1 IMAGING OF MOLECULAR CHAIN ORDER 294
13.4.2 NANOSTRUCTURE OF POLYETHYLENE TAPES AND FIBERS 296 13.4.3 OTHER
ORIENTED POLYMER SAMPLES 303 13.5 AFM OF DI-BLOCK COPOLYMERS 303 13.5.1
POLY(STYRENE-B-ISOPRENE) FILMS 305 13.5.2 POLY(STYRENE-B-METHYL
METHACRYLATE) AND POLY(STYRENE-B-2-VINYL- PYRIDINE) FILMS 306 13.6
CONCLUDING REMARKS 308 REFERENCES 310 14 FUTURE OUTLOOK 313
ACKNOWLEDGEMENTS 317 INDEX 319
|
| any_adam_object | 1 |
| author | Magonov, Sergei N. Whangbo, Myung-Hwan |
| author_facet | Magonov, Sergei N. Whangbo, Myung-Hwan |
| author_role | aut aut |
| author_sort | Magonov, Sergei N. |
| author_variant | s n m sn snm m h w mhw |
| building | Verbundindex |
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| callnumber-subject | TA - General and Civil Engineering |
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| ctrlnum | (OCoLC)34465326 (DE-599)BVBBV010483978 |
| dewey-full | 620.11 502.82 |
| dewey-hundreds | 600 - Technology (Applied sciences) 500 - Natural sciences and mathematics |
| dewey-ones | 620 - Engineering and allied operations 502 - Miscellany |
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| dewey-search | 620.11 502.82 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations 500 - Natural sciences and mathematics |
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| id | DE-604.BV010483978 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:53:17Z |
| institution | BVB |
| isbn | 3527293132 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006986779 |
| oclc_num | 34465326 |
| open_access_boolean | |
| owner | DE-29T DE-703 DE-20 DE-M347 DE-19 DE-BY-UBM DE-91G DE-BY-TUM DE-384 DE-355 DE-BY-UBR DE-1043 DE-634 DE-83 DE-11 |
| owner_facet | DE-29T DE-703 DE-20 DE-M347 DE-19 DE-BY-UBM DE-91G DE-BY-TUM DE-384 DE-355 DE-BY-UBR DE-1043 DE-634 DE-83 DE-11 |
| physical | XII, 323 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | VCH |
| record_format | marc |
| spelling | Magonov, Sergei N. Verfasser aut Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov ; Myung-Hwan Whangbo Weinheim [u.a.] VCH 1996 XII, 323 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben AFM gtt Oppervlakken gtt Scanning tunneling microscopy gtt Atomic force microscopy Electric insulators and insulation Testing Metals Surfaces Analysis Scanning tunneling microscopy Semiconductors Testing Surfaces (Technology) Analysis Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Rastertunnelmikroskopie (DE-588)4252995-5 s DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s Whangbo, Myung-Hwan Verfasser aut GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006986779&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Magonov, Sergei N. Whangbo, Myung-Hwan Surface analysis with STM and AFM experimental and theoretical aspects of image analysis AFM gtt Oppervlakken gtt Scanning tunneling microscopy gtt Atomic force microscopy Electric insulators and insulation Testing Metals Surfaces Analysis Scanning tunneling microscopy Semiconductors Testing Surfaces (Technology) Analysis Oberflächenanalyse (DE-588)4172243-7 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4172243-7 (DE-588)4252995-5 (DE-588)4274473-8 |
| title | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis |
| title_auth | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis |
| title_exact_search | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis |
| title_full | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov ; Myung-Hwan Whangbo |
| title_fullStr | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov ; Myung-Hwan Whangbo |
| title_full_unstemmed | Surface analysis with STM and AFM experimental and theoretical aspects of image analysis Sergei N. Magonov ; Myung-Hwan Whangbo |
| title_short | Surface analysis with STM and AFM |
| title_sort | surface analysis with stm and afm experimental and theoretical aspects of image analysis |
| title_sub | experimental and theoretical aspects of image analysis |
| topic | AFM gtt Oppervlakken gtt Scanning tunneling microscopy gtt Atomic force microscopy Electric insulators and insulation Testing Metals Surfaces Analysis Scanning tunneling microscopy Semiconductors Testing Surfaces (Technology) Analysis Oberflächenanalyse (DE-588)4172243-7 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | AFM Oppervlakken Scanning tunneling microscopy Atomic force microscopy Electric insulators and insulation Testing Metals Surfaces Analysis Semiconductors Testing Surfaces (Technology) Analysis Oberflächenanalyse Rastertunnelmikroskopie Rasterkraftmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006986779&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT magonovsergein surfaceanalysiswithstmandafmexperimentalandtheoreticalaspectsofimageanalysis AT whangbomyunghwan surfaceanalysiswithstmandafmexperimentalandtheoreticalaspectsofimageanalysis |