Monte Carlo modeling for electron microscopy and microanalysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Oxford Univ. Press
1995
|
| Schriftenreihe: | Oxford series in optical and imaging sciences
9 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | VIII, 216 S. graph. Darst. |
| ISBN: | 0195088743 |
Internformat
MARC
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Datensatz im Suchindex
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|---|---|
| adam_text | MONTE CARLO MODELING FOR ELECTRON MICROSCOPY AND MICROANALYSIS DAVID C.
JOY NEW YORK OXFORD OXFORD UNIVERSITY PRESS 1995 CONTENTS 1. AN
INTRODUCTION TO MONTE CARLO METHODS 1.1. ELECTRON BEAM INTERACTION*THE
PROBLEM 3 1.2. THE MONTE CARLO METHOD 4 1.3. BRIEF HISTORY OF MONTE
CARLO MODELING 5 1.4. ABOUT THIS BOOK 7 2. CONSTRUCTING A SIMULATION 9
2.1. INTRODUCTION 9 2.2. DESCRIBING THE PROBLEM 9 2.3. PROGRAMMING THE
SIMULATION 12 2.4. READING A PASCAL PROGRAM 13 2.5. RUNNING THE
SIMULATION 23 3. THE SINGLE SCATTERING MODEL 25 3.1. INTRODUCTION 25
3.2. ASSUMPTIONS OF THE SINGLE SCATTERING MODEL 25 3.3. THE SINGLE
SCATTERING MODEL 26 3.4. THE SINGLE SCATTERING MONTE CARLO CODE 37 3.5.
NOTES ON THE PROCEDURES AND FUNCTIONS USED IN THE PROGRAM 46 3.6.
RUNNING THE PROGRAM 50 4. THE PLURAL SCATTERING MODEL 56 4.1.
INTRODUCTION 56 4.2. ASSUMPTIONS OF THE PLURAL SCATTERING MODEL 56 4.3.
THE PLURAL SCATTERING MONTE CARLO CODE 62 4.4. NOTES ON THE PROCEDURES
AND FUNCTIONS USED IN THE PROGRAM 71 4.5. RUNNING THE PROGRAM 75 5. THE
PRACTICAL APPLICATION OF MONTE CARLO MODELS 7 7 5.1. GENERAL
CONSIDERATIONS 77 5.2. WHICH TYPE OF MONTE CARLO MODEL SHOULD BE USED?
77 VLLL CONTENTS 5.3. CUSTOMIZING THE GENERIC PROGRAMS 78 5.4. THE ALL
PURPOSE PROGRAM 79 5.5. THE APPLICABILITY OF MONTE CARLO TECHNIQUES 79
6. BACKSCATTERED ELECTRONS 81 6.1. BACKSCATTERED ELECTRONS 81 6.2.
TESTING THE MONTE CARLO MODELS OF BACKSCATTERING 81 6.3. PREDICTIONS OF
THE MONTE CARLO MODELS 90 6.4. MODELING INHOMOGENEOUS MATERIALS 97 6.5.
NOTES ON THE PROGRAM 105 6.6. INCORPORATING DETECTOR GEOMETRY AND
EFFICIENCY 111 7. CHARGE COLLECTION MICROSCOPY AND CATHODOLUMINESCENCE
114 7.1. INTRODUCTION 114 7.2. THE PRINCIPLES OF EBIC AND C/L IMAGE
FORMATION 114 7.3. MONTE CARLO MODELING OF CHARGE COLLECTION MICROSCOPY
119 0 8. SECONDARY ELECTRONS AND IMAGING 134 8.1. INTRODUCTION 134 8.2.
FIRST PRINCIPLES*SE MODELS 136 8.3. THE FAST SECONDARY MODEL 142 8.4.
THE PARAMETRIC MODEL 156 9. X-RAY PRODUCTION AND MICROANALYSIS 174 9.1.
INTRODUCTION 174 9.2. THE GENERATION OF CHARACTERISTIC X-RAYS 174 9.3.
THE GENERATION OF CONTINUUM X-RAYS 175 9.4. X-RAY PRODUCTION IN THIN
FILMS 177 9.5. X-RAY PRODUCTION IN BULK SAMPLES 191 10. WHAT NEXT IN
MONTE CARLO SIMULATIONS? 199 10.1. IMPROVING THE MONTE CARLO MODEL 199
10.2. FASTER MONTE CARLO MODELING 202 10.3. ALTERNATIVES TO SEQUENTIAL
MONTE CARLO MODELING 203 10.4. CONCLUSIONS 205 REFERENCES 207 INDEX 213
|
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| dewey-full | 502/.8/25 |
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| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
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| id | DE-604.BV010438313 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:52:34Z |
| institution | BVB |
| isbn | 0195088743 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006956481 |
| oclc_num | 31287442 |
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| owner | DE-384 DE-29T DE-703 DE-83 DE-11 |
| owner_facet | DE-384 DE-29T DE-703 DE-83 DE-11 |
| physical | VIII, 216 S. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series | Oxford series in optical and imaging sciences |
| series2 | Oxford series in optical and imaging sciences |
| spelling | Joy, David C. 1943- Verfasser (DE-588)17217242X aut Monte Carlo modeling for electron microscopy and microanalysis David C. Joy New York [u.a.] Oxford Univ. Press 1995 VIII, 216 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Oxford series in optical and imaging sciences 9 Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation (DE-588)4240945-7 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Monte-Carlo-Simulation (DE-588)4240945-7 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Oxford series in optical and imaging sciences 9 (DE-604)BV008283319 9 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006956481&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Joy, David C. 1943- Monte Carlo modeling for electron microscopy and microanalysis Oxford series in optical and imaging sciences Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4240945-7 (DE-588)4151898-6 (DE-588)4014327-2 |
| title | Monte Carlo modeling for electron microscopy and microanalysis |
| title_auth | Monte Carlo modeling for electron microscopy and microanalysis |
| title_exact_search | Monte Carlo modeling for electron microscopy and microanalysis |
| title_full | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_fullStr | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_full_unstemmed | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
| title_short | Monte Carlo modeling for electron microscopy and microanalysis |
| title_sort | monte carlo modeling for electron microscopy and microanalysis |
| topic | Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation Elektronenstrahlmikroanalyse Elektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006956481&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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