1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors: Istituto SS. Annunziata, Firenze, 7 - 9 July 1993
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Bologna
Ed. Compositori
1994
|
| Schriftenreihe: | Società Italiana di Fisica: Atti di conferenze
46 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | PT: 1a Conferenza Internazionale sulle Applicazioni su Larga Scala e Danneggiamento da Radiazione di Rivelatori a Semiconduttore |
| Beschreibung: | XIII, 195 S. Ill., graph. Darst. |
| ISBN: | 8877940638 |
Internformat
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Datensatz im Suchindex
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| adam_text | ITALIAN PHYSICAL SOCIETY CONFERENCE PROCEEDINGS VOLUME 46 1 ST
INTERNATIONAL CONFERENCE ON LARGE SCALE APPLICATIONS AND RADIATION
HARDNESS OF SEMICONDUCTOR DETECTORS EDITED BY A. BALDINI AND E. FOCARDI
ISTITUTO SS. ANNUNZIATA - FIRENZE, 7-9 JULY 1993 ITALIAN PHYSICAL
SOCIETY BOLOGNA - ITALY CONTENTS PAGE LIST OF PARTICIPANTS IX A. BALDINI
AND E. FOCARDI - FOREWORD XIII CALORIMETRY INVITED TALK - P. SPILLANTINI
- (TEXT NOT RECEIVED) TH. KUBICKI, K. LUBELSMEYER, J. ORTMANNS, M.
TOPOROWSKY AND W. J. XIAO - DEVELOPMENT OF GAAS DETECTORS AT RWTH AACHEN
3 R. J. TESAREK, R. GILMAN, G. KUMBARTSKI, M. H. LEE, P. RUTT, F.
SANNES, S. SCHNETZER, S. V. SOMALWAR, R. STO- NE, G. B. THOMSON, M.
FRANKLIN, S. KANDA, B. MOROZOV, Y. SUGIMOTO, S. HAN, D. R. KANIA, L. S.
PAN, D. FUJI- NO, K. K. GAN, H. KAGAN, R. KASS, R. MALCHOW, W. PAL- MER,
C. WHITE, S. ZHAO AND S. K. KIM - FIRST BEAM TEST RESULTS OF A
DIAMOND-TUNGSTEN SAMPLING CALORIMETER.... 17 V. EREMIN, A. IVANOV, N.
STROKAN, E. VERBITSKAYA, N. EGO- ROV, I. GOLUTVIN, A. RASHEVSKY AND N.
ZAMYATIN CHARGE COLLECTION EFFICIENCY IN SILICON DETECTORS DE- SIGNED IN
DUBNA R&D PROGRAM FOR HADRON CALORIMETRY.... 29 W. M. BUGG - STUDY OF
QED AT CRITICAL FIELD STRENGTH IN INTENSE LASER-HIGH ENERGY ELECTRON
COLLISIONS (TEXT NOT RECEIVED) TRACKING INVITED TALK - A. LITRE - (TEXT
NOT RECEIVED) L. BOSISIO - ALEPH VERTEX DETECTOR UPGRADE (TEXT NOT
RECEIVED) 0. RUNOLFSSON AND THE OPAL COLLABORATION - A SILICON MI-
CROSTRIP VERTEX DETECTOR WITH TWO-COORDINATE READOUT FOR THE OPAL
EXPERIMENT 53 E. FOCARDI - THE SILICON TRACKER OF CMS 63 R. BATTISTON -
SILICON TRACKER OF L3 EXPERIMENT: CURRENT STATUS AND FUTURE PROSPECTS OF
COLLIDER DETECTOR DE- SIGN (TEXT NOT RECEIVED) VII RADIATION EFFECTS AND
HARDNESS INVITED TALK - G. HALL - RADIATION DAMAGE TO SEMICON- DUCTORS
75 G. H.R. KEGEL, P. F. BERTONE, D. L. CASE, D. J. DESIMONE, C.K.C. JEN
AND C. NARAYAN - RADIATION DAMAGE STUDIES WITH ACCELERATOR GENERATED
NEUTRONS 87 Z. LI - RESISTIVITY MEASUREMENTS ON THE NEUTRON IRRADIAT- ED
DETECTOR GRADE SILICON MATERIALS 101 U. BIGGERI, E. BORCHI, M. BRUZZI,
S. LAZANU, Z. LI AND R. BEUTTENMULLER - TYPE INVERSION MEASUREMENTS ON
IRRA- DIATED SILICON BY MEANS OF HALL EFFECT 115 Z. LI, H. W. KRANER, S.
LAZANU, U. BIGGERI, E. BORCHI AND M. BRUZZI - INFLUENCE OF OXIDATION ON
RADIATION HARD- NESS OF SILICON DETECTORS 123 N. BACCHETTA, D. BISELLO,
C. CANALI, R. DA ROS, P.G. FUO- CHI, A. GIRALDO, YU. GOTRA, A.
PACCAGNELLA AND G. VER- ZELLESI - RADIATION INDUCED DEGRADATION OF FIELD
OXIDE FET (FOXFET) IN MICROSTRIP DETECTORS 131 H. W. KRANER, R.
BEUTTENMULLER, W. CHEN, L. DOU, E. FRET- WURST, J. A. KIERSTEAD, G.
LINDSTROEM, Z. LI AND Y. ZHANG - IONIZING RADIATION EFFECTS ON SILICON
TEST STRUCTURES 141 R. WHEADON AND THE RD20 COLLABORATION - RADIATION
TOL- ERANCE OF SILICON MICROSTRIPS 159 F. LEMEILLEUR, M. GLASER, E. H.
M. HEIJNE, P. JARRON, C. SOAVE, C. LEROY, J. RIOUX, P.ROY, M. SIAD AND
I. TRIG- GER - CHARGE TRANSPORT IN SILICON DETECTORS 167 C. SOAVE -
NEUTRON, PROTON AND GAMMA IRRADIATION OF SI- LICON DETECTORS (TEXT NOT
RECEIVED) V. EREMIN, A. IVANOV, N. STROKAN, E. VERBITSKAYA, B. SCHMIDT
AND Z. LI - RELAXATION OF RADIATION DAMAGES IN SILICON PLANAR DETECTORS
181 J. COLLOT, P. DE SAINTIGNON, P. GABOR, A. HOUMMADA, PH. JEAN, E.
LEON FLORIAN, C. LEROY, G. MAHOUT, F. MERCHEZ AND B. MERKEL - SARA, A
NEUTRON IRRADIATION STATION FEATURING CRYOGENIC TEMPERATURES 191 VIII
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| genre_facet | Konferenzschrift 1993 Florenz |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T17:51:35Z |
| institution | BVB |
| institution_GND | (DE-588)5154228-6 |
| isbn | 8877940638 |
| language | English |
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| physical | XIII, 195 S. Ill., graph. Darst. |
| publishDate | 1994 |
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| series | Società Italiana di Fisica: Atti di conferenze |
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| spelling | International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors 1 1993 Florenz Verfasser (DE-588)5154228-6 aut 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 Italian Physical Society. Ed. by A. Baldini ... First International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Large-scale applications and radiation hardness of semiconductor detectors Large scale applications and radiation hardness of semiconductor detectors Bologna Ed. Compositori 1994 XIII, 195 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Società Italiana di Fisica: Atti di conferenze 46 PT: 1a Conferenza Internazionale sulle Applicazioni su Larga Scala e Danneggiamento da Radiazione di Rivelatori a Semiconduttore Halbleiterdetektor (DE-588)4158795-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1993 Florenz gnd-content Halbleiterdetektor (DE-588)4158795-9 s DE-604 Baldini, Alberto Sonstige oth Società Italiana di Fisica: Atti di conferenze 46 (DE-604)BV001898093 46 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006914855&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 Società Italiana di Fisica: Atti di conferenze Halbleiterdetektor (DE-588)4158795-9 gnd |
| subject_GND | (DE-588)4158795-9 (DE-588)1071861417 |
| title | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 |
| title_alt | First International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Large-scale applications and radiation hardness of semiconductor detectors Large scale applications and radiation hardness of semiconductor detectors |
| title_auth | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 |
| title_exact_search | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 |
| title_full | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 Italian Physical Society. Ed. by A. Baldini ... |
| title_fullStr | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 Italian Physical Society. Ed. by A. Baldini ... |
| title_full_unstemmed | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 Italian Physical Society. Ed. by A. Baldini ... |
| title_short | 1st International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
| title_sort | 1st international conference on large scale applications and radiation hardness of semiconductor detectors istituto ss annunziata firenze 7 9 july 1993 |
| title_sub | Istituto SS. Annunziata, Firenze, 7 - 9 July 1993 |
| topic | Halbleiterdetektor (DE-588)4158795-9 gnd |
| topic_facet | Halbleiterdetektor Konferenzschrift 1993 Florenz |
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| volume_link | (DE-604)BV001898093 |
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