Scanning tunneling microscopy: special issue ; [the 2nd International Colloquium on Scanning Tunneling Microscopy was held at Kanazawa Institute of Technology from December 8 to 10, 1994]
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Bibliographic Details
Format: Conference Proceeding Book
Language:Undetermined
Published: Tokyo Japanese Journal of Applied Physics 1995
Series:Japanese journal of applied physics / A 34,6/2
Subjects:
Item Description:Einzelaufnahme eines Zs.-Heftes
Physical Description:S. 3309 - 3411 graph. Darst.

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