Elektronenmikroskopie: Grundlagen - Methoden - Anwendungen
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Heidelberg [u.a.]
Spektrum, Akad. Verl.
1995
|
| Schlagworte: | |
| Beschreibung: | VIII, 279 S. Ill., graph. Darst. |
| ISBN: | 3860253417 |
Internformat
MARC
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| 001 | BV010340594 | ||
| 003 | DE-604 | ||
| 005 | 20090115 | ||
| 007 | t | ||
| 008 | 950807s1995 gw ad|| |||| 00||| ger d | ||
| 020 | |a 3860253417 |9 3-86025-341-7 | ||
| 035 | |a (OCoLC)64525494 | ||
| 035 | |a (DE-599)BVBBV010340594 | ||
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| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
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| 084 | |a ZM 3700 |0 (DE-625)157028: |2 rvk | ||
| 084 | |a ZM 8150 |0 (DE-625)159844: |2 rvk | ||
| 084 | |a CHE 264f |2 stub | ||
| 084 | |a ELT 386f |2 stub | ||
| 084 | |a PHY 135f |2 stub | ||
| 084 | |a GEO 412f |2 stub | ||
| 100 | 1 | |a Flegler, Stanley L. |e Verfasser |4 aut | |
| 240 | 1 | 0 | |a Scanning and transmission electron microscopy |
| 245 | 1 | 0 | |a Elektronenmikroskopie |b Grundlagen - Methoden - Anwendungen |c Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
| 264 | 1 | |a Heidelberg [u.a.] |b Spektrum, Akad. Verl. |c 1995 | |
| 300 | |a VIII, 279 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Electron Microscopy |2 cabt | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Heckman, John W. |e Verfasser |4 aut | |
| 700 | 1 | |a Klomparens, Karen L. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006882856 | ||
Datensatz im Suchindex
| _version_ | 1804124762378600448 |
|---|---|
| any_adam_object | |
| author | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. |
| author_facet | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. |
| author_role | aut aut aut |
| author_sort | Flegler, Stanley L. |
| author_variant | s l f sl slf j w h jw jwh k l k kl klk |
| building | Verbundindex |
| bvnumber | BV010340594 |
| classification_rvk | UH 6300 WC 3100 ZM 3700 ZM 8150 |
| classification_tum | CHE 264f ELT 386f PHY 135f GEO 412f |
| ctrlnum | (OCoLC)64525494 (DE-599)BVBBV010340594 |
| discipline | Geowissenschaften Physik Biologie Chemie Elektrotechnik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| id | DE-604.BV010340594 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:50:49Z |
| institution | BVB |
| isbn | 3860253417 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006882856 |
| oclc_num | 64525494 |
| open_access_boolean | |
| owner | DE-859 DE-70 DE-29T DE-29 DE-1046 DE-1047 DE-M347 DE-20 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-92 DE-Aug4 DE-384 DE-1028 DE-19 DE-BY-UBM DE-703 DE-1050 DE-91G DE-BY-TUM DE-706 DE-522 DE-Eb1 DE-523 DE-634 DE-83 DE-188 DE-B16 DE-M515 |
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| physical | VIII, 279 S. Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Spektrum, Akad. Verl. |
| record_format | marc |
| spelling | Flegler, Stanley L. Verfasser aut Scanning and transmission electron microscopy Elektronenmikroskopie Grundlagen - Methoden - Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens Heidelberg [u.a.] Spektrum, Akad. Verl. 1995 VIII, 279 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electron Microscopy cabt Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Heckman, John W. Verfasser aut Klomparens, Karen L. Verfasser aut |
| spellingShingle | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. Elektronenmikroskopie Grundlagen - Methoden - Anwendungen Electron Microscopy cabt Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Elektronenmikroskopie Grundlagen - Methoden - Anwendungen |
| title_alt | Scanning and transmission electron microscopy |
| title_auth | Elektronenmikroskopie Grundlagen - Methoden - Anwendungen |
| title_exact_search | Elektronenmikroskopie Grundlagen - Methoden - Anwendungen |
| title_full | Elektronenmikroskopie Grundlagen - Methoden - Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
| title_fullStr | Elektronenmikroskopie Grundlagen - Methoden - Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
| title_full_unstemmed | Elektronenmikroskopie Grundlagen - Methoden - Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens |
| title_short | Elektronenmikroskopie |
| title_sort | elektronenmikroskopie grundlagen methoden anwendungen |
| title_sub | Grundlagen - Methoden - Anwendungen |
| topic | Electron Microscopy cabt Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron Microscopy Elektronenmikroskopie |
| work_keys_str_mv | AT fleglerstanleyl scanningandtransmissionelectronmicroscopy AT heckmanjohnw scanningandtransmissionelectronmicroscopy AT klomparenskarenl scanningandtransmissionelectronmicroscopy AT fleglerstanleyl elektronenmikroskopiegrundlagenmethodenanwendungen AT heckmanjohnw elektronenmikroskopiegrundlagenmethodenanwendungen AT klomparenskarenl elektronenmikroskopiegrundlagenmethodenanwendungen |