Proceedings of the third Asian Test Symposium: November 15 - 17, 1994, Nara, Japan
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Los Alamitos, Calif. u.a.
IEEE Computer Soc. Press
1994
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| Subjects: | |
| Physical Description: | XIV, 392 S. Ill., graph. Darst. |
| ISBN: | 0818666900 |
Staff View
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Record in the Search Index
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| author_corporate | Asian Test Symposium Nara, Nara-Ken |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| indexdate | 2025-01-10T13:16:00Z |
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| isbn | 0818666900 |
| language | English |
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| physical | XIV, 392 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | Asian Test Symposium 3 1994 Nara, Nara-Ken Verfasser (DE-588)5161786-9 aut Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan Los Alamitos, Calif. u.a. IEEE Computer Soc. Press 1994 XIV, 392 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_auth | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_exact_search | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_full | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_fullStr | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_full_unstemmed | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_short | Proceedings of the third Asian Test Symposium |
| title_sort | proceedings of the third asian test symposium november 15 17 1994 nara japan |
| title_sub | November 15 - 17, 1994, Nara, Japan |
| topic | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| topic_facet | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses Konferenzschrift |
| work_keys_str_mv | AT asiantestsymposiumnaranaraken proceedingsofthethirdasiantestsymposiumnovember15171994narajapan |