Proceedings of the third Asian Test Symposium: November 15 - 17, 1994, Nara, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. u.a.
IEEE Computer Soc. Press
1994
|
| Schlagworte: | |
| Beschreibung: | XIV, 392 S. Ill., graph. Darst. |
| ISBN: | 0818666900 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV010206963 | ||
| 003 | DE-604 | ||
| 005 | 19951116 | ||
| 007 | t | ||
| 008 | 950531s1994 ad|| |||| 10||| eng d | ||
| 020 | |a 0818666900 |9 0-8186-6690-0 | ||
| 035 | |a (OCoLC)31802699 | ||
| 035 | |a (DE-599)BVBBV010206963 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-739 |a DE-91 |a DE-83 | ||
| 050 | 0 | |a TK7888.4 | |
| 082 | 0 | |a 621.381548 |b As42p, 1994 |2 20 | |
| 084 | |a SS 1800 |0 (DE-625)143376: |2 rvk | ||
| 084 | |a SS 1994 |0 (DE-625)143431: |2 rvk | ||
| 084 | |a ELT 359f |2 stub | ||
| 111 | 2 | |a Asian Test Symposium |n 3 |d 1994 |c Nara, Nara-Ken |j Verfasser |0 (DE-588)5161786-9 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the third Asian Test Symposium |b November 15 - 17, 1994, Nara, Japan |
| 264 | 1 | |a Los Alamitos, Calif. u.a. |b IEEE Computer Soc. Press |c 1994 | |
| 300 | |a XIV, 392 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electronic circuits |x Testing |v Congresses | |
| 650 | 4 | |a Electronic digital computers |x Circuits |x Testing |v Congresses | |
| 650 | 4 | |a Fault-tolerant computing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006782083 | ||
Datensatz im Suchindex
| _version_ | 1804124612632510464 |
|---|---|
| any_adam_object | |
| author_corporate | Asian Test Symposium Nara, Nara-Ken |
| author_corporate_role | aut |
| author_facet | Asian Test Symposium Nara, Nara-Ken |
| author_sort | Asian Test Symposium Nara, Nara-Ken |
| building | Verbundindex |
| bvnumber | BV010206963 |
| callnumber-first | T - Technology |
| callnumber-label | TK7888 |
| callnumber-raw | TK7888.4 |
| callnumber-search | TK7888.4 |
| callnumber-sort | TK 47888.4 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | SS 1800 SS 1994 |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)31802699 (DE-599)BVBBV010206963 |
| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381548 |
| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01278nam a2200361 c 4500</leader><controlfield tag="001">BV010206963</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19951116 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">950531s1994 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818666900</subfield><subfield code="9">0-8186-6690-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)31802699</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV010206963</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7888.4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381548</subfield><subfield code="b">As42p, 1994</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SS 1800</subfield><subfield code="0">(DE-625)143376:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SS 1994</subfield><subfield code="0">(DE-625)143431:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Asian Test Symposium</subfield><subfield code="n">3</subfield><subfield code="d">1994</subfield><subfield code="c">Nara, Nara-Ken</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5161786-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the third Asian Test Symposium</subfield><subfield code="b">November 15 - 17, 1994, Nara, Japan</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. u.a.</subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIV, 392 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="x">Circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault-tolerant computing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006782083</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV010206963 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:48:26Z |
| institution | BVB |
| institution_GND | (DE-588)5161786-9 |
| isbn | 0818666900 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006782083 |
| oclc_num | 31802699 |
| open_access_boolean | |
| owner | DE-739 DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-739 DE-91 DE-BY-TUM DE-83 |
| physical | XIV, 392 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | Asian Test Symposium 3 1994 Nara, Nara-Ken Verfasser (DE-588)5161786-9 aut Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan Los Alamitos, Calif. u.a. IEEE Computer Soc. Press 1994 XIV, 392 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_auth | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_exact_search | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_full | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_fullStr | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_full_unstemmed | Proceedings of the third Asian Test Symposium November 15 - 17, 1994, Nara, Japan |
| title_short | Proceedings of the third Asian Test Symposium |
| title_sort | proceedings of the third asian test symposium november 15 17 1994 nara japan |
| title_sub | November 15 - 17, 1994, Nara, Japan |
| topic | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| topic_facet | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses Konferenzschrift |
| work_keys_str_mv | AT asiantestsymposiumnaranaraken proceedingsofthethirdasiantestsymposiumnovember15171994narajapan |