Ballistic electron emission microscopy (beem): studies of metal/semiconductor interfaces with nanometer resolution
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
North-Holland
1995
|
| Schriftenreihe: | Physics reports
253,4 |
| Schlagworte: | |
| Beschreibung: | S. 165 - 233 Ill., graph. Darst. |
Internformat
MARC
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| 100 | 1 | |a Prietsch, Mario |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Ballistic electron emission microscopy (beem) |b studies of metal/semiconductor interfaces with nanometer resolution |c Mario Prietsch |
| 264 | 1 | |a Amsterdam u.a. |b North-Holland |c 1995 | |
| 300 | |a S. 165 - 233 |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Physics reports |v 253,4 | |
| 650 | 0 | 7 | |a Ballistische-Elektronen-Emissions-Mikroskopie |0 (DE-588)4341053-4 |2 gnd |9 rswk-swf |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-006705324 | ||
Datensatz im Suchindex
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| any_adam_object | |
| author | Prietsch, Mario |
| author_facet | Prietsch, Mario |
| author_role | aut |
| author_sort | Prietsch, Mario |
| author_variant | m p mp |
| building | Verbundindex |
| bvnumber | BV010100846 |
| ctrlnum | (OCoLC)150503706 (DE-599)BVBBV010100846 |
| format | Book |
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| id | DE-604.BV010100846 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:46:30Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006705324 |
| oclc_num | 150503706 |
| open_access_boolean | |
| owner | DE-384 DE-29T DE-703 |
| owner_facet | DE-384 DE-29T DE-703 |
| physical | S. 165 - 233 Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | North-Holland |
| record_format | marc |
| series | Physics reports |
| series2 | Physics reports |
| spelling | Prietsch, Mario Verfasser aut Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution Mario Prietsch Amsterdam u.a. North-Holland 1995 S. 165 - 233 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Physics reports 253,4 Ballistische-Elektronen-Emissions-Mikroskopie (DE-588)4341053-4 gnd rswk-swf Ballistische-Elektronen-Emissions-Mikroskopie (DE-588)4341053-4 s DE-604 Physics reports 253,4 (DE-604)BV002784816 253,4 |
| spellingShingle | Prietsch, Mario Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution Physics reports Ballistische-Elektronen-Emissions-Mikroskopie (DE-588)4341053-4 gnd |
| subject_GND | (DE-588)4341053-4 |
| title | Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution |
| title_auth | Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution |
| title_exact_search | Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution |
| title_full | Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution Mario Prietsch |
| title_fullStr | Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution Mario Prietsch |
| title_full_unstemmed | Ballistic electron emission microscopy (beem) studies of metal/semiconductor interfaces with nanometer resolution Mario Prietsch |
| title_short | Ballistic electron emission microscopy (beem) |
| title_sort | ballistic electron emission microscopy beem studies of metal semiconductor interfaces with nanometer resolution |
| title_sub | studies of metal/semiconductor interfaces with nanometer resolution |
| topic | Ballistische-Elektronen-Emissions-Mikroskopie (DE-588)4341053-4 gnd |
| topic_facet | Ballistische-Elektronen-Emissions-Mikroskopie |
| volume_link | (DE-604)BV002784816 |
| work_keys_str_mv | AT prietschmario ballisticelectronemissionmicroscopybeemstudiesofmetalsemiconductorinterfaceswithnanometerresolution |