System test and diagnosis:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston u.a.
Kluwer
1994
|
| Schlagworte: | |
| Beschreibung: | XVI, 382 S. graph. Darst. |
| ISBN: | 0792394755 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV010077611 | ||
| 003 | DE-604 | ||
| 005 | 19950918 | ||
| 007 | t | ||
| 008 | 950306s1994 d||| |||| 00||| eng d | ||
| 020 | |a 0792394755 |9 0-7923-9475-5 | ||
| 035 | |a (OCoLC)30546185 | ||
| 035 | |a (DE-599)BVBBV010077611 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-91 |a DE-634 | ||
| 050 | 0 | |a TK7870.2 | |
| 082 | 0 | |a 620/.0044 |2 20 | |
| 084 | |a TEC 700f |2 stub | ||
| 100 | 1 | |a Simpson, William R. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a System test and diagnosis |c by William R. Simpson and John W. Sheppard |
| 264 | 1 | |a Boston u.a. |b Kluwer |c 1994 | |
| 300 | |a XVI, 382 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Systeemanalyse |2 gtt | |
| 650 | 7 | |a Systeemontwerp |2 gtt | |
| 650 | 4 | |a Automatic test equipment | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing | |
| 650 | 4 | |a Electronic circuits |x Testing | |
| 650 | 4 | |a Fault-tolerant computing | |
| 650 | 0 | 7 | |a Fehleranalyse |0 (DE-588)4016608-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Technisches System |0 (DE-588)4126276-1 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Fehleranalyse |0 (DE-588)4016608-9 |D s |
| 689 | 0 | 1 | |a Technisches System |0 (DE-588)4126276-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Sheppard, John W. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006688622 | ||
Datensatz im Suchindex
| _version_ | 1804124465897930752 |
|---|---|
| any_adam_object | |
| author | Simpson, William R. Sheppard, John W. |
| author_facet | Simpson, William R. Sheppard, John W. |
| author_role | aut aut |
| author_sort | Simpson, William R. |
| author_variant | w r s wr wrs j w s jw jws |
| building | Verbundindex |
| bvnumber | BV010077611 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870.2 |
| callnumber-search | TK7870.2 |
| callnumber-sort | TK 47870.2 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | TEC 700f |
| ctrlnum | (OCoLC)30546185 (DE-599)BVBBV010077611 |
| dewey-full | 620/.0044 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620/.0044 |
| dewey-search | 620/.0044 |
| dewey-sort | 3620 244 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Technik |
| format | Book |
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| id | DE-604.BV010077611 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:46:06Z |
| institution | BVB |
| isbn | 0792394755 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006688622 |
| oclc_num | 30546185 |
| open_access_boolean | |
| owner | DE-29T DE-91 DE-BY-TUM DE-634 |
| owner_facet | DE-29T DE-91 DE-BY-TUM DE-634 |
| physical | XVI, 382 S. graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Kluwer |
| record_format | marc |
| spelling | Simpson, William R. Verfasser aut System test and diagnosis by William R. Simpson and John W. Sheppard Boston u.a. Kluwer 1994 XVI, 382 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Systeemanalyse gtt Systeemontwerp gtt Automatic test equipment Electronic apparatus and appliances Testing Electronic circuits Testing Fault-tolerant computing Fehleranalyse (DE-588)4016608-9 gnd rswk-swf Technisches System (DE-588)4126276-1 gnd rswk-swf Fehleranalyse (DE-588)4016608-9 s Technisches System (DE-588)4126276-1 s DE-604 Sheppard, John W. Verfasser aut |
| spellingShingle | Simpson, William R. Sheppard, John W. System test and diagnosis Systeemanalyse gtt Systeemontwerp gtt Automatic test equipment Electronic apparatus and appliances Testing Electronic circuits Testing Fault-tolerant computing Fehleranalyse (DE-588)4016608-9 gnd Technisches System (DE-588)4126276-1 gnd |
| subject_GND | (DE-588)4016608-9 (DE-588)4126276-1 |
| title | System test and diagnosis |
| title_auth | System test and diagnosis |
| title_exact_search | System test and diagnosis |
| title_full | System test and diagnosis by William R. Simpson and John W. Sheppard |
| title_fullStr | System test and diagnosis by William R. Simpson and John W. Sheppard |
| title_full_unstemmed | System test and diagnosis by William R. Simpson and John W. Sheppard |
| title_short | System test and diagnosis |
| title_sort | system test and diagnosis |
| topic | Systeemanalyse gtt Systeemontwerp gtt Automatic test equipment Electronic apparatus and appliances Testing Electronic circuits Testing Fault-tolerant computing Fehleranalyse (DE-588)4016608-9 gnd Technisches System (DE-588)4126276-1 gnd |
| topic_facet | Systeemanalyse Systeemontwerp Automatic test equipment Electronic apparatus and appliances Testing Electronic circuits Testing Fault-tolerant computing Fehleranalyse Technisches System |
| work_keys_str_mv | AT simpsonwilliamr systemtestanddiagnosis AT sheppardjohnw systemtestanddiagnosis |