Laser dimensional metrology: recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE, Internat. Soc. for Optical Engineering
1994
|
| Schriftenreihe: | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE
2088 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | IX, 216 S. Ill., graph. Darst. |
| ISBN: | 0819413593 |
Internformat
MARC
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| 245 | 1 | 0 | |a Laser dimensional metrology |b recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom |c M. J. Downs, chair |
| 264 | 1 | |a Bellingham, Wash. |b SPIE, Internat. Soc. for Optical Engineering |c 1994 | |
| 300 | |a IX, 216 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 1 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 2088 | |
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Datensatz im Suchindex
| _version_ | 1804124463486205952 |
|---|---|
| adam_text | Contents
vii
Conference
Committee
ix
Introduction
SESSION
1
TECHNOLOGY OF MEASUREMENT
2
Trends in instrumentation for roughness and form measurement
[2088-02}
D. J. Whitehouse, Univ. of Warwick (UK)
18
Laser-beam scanning
[2088-03]
D. P. Rowe, P. M. Watts, GEC-Marconi Research Or. (UK)
27
Validation of assessment software in dimensional metrology
[2088-04]
A. B. Forbes, National Physical Lab. (UK)
3 7
Adaptive optics
[2088-05]
F. Merkle, Carl
Zeiss
Jena GmbH (FRG)
SESSION
2
COMPONENTS AND SUBSYSTEMS
____________________________
46
Comparison of long-range and
interferometrie
laser distance instruments using multiple
reflections
[2088-06]
D. C. Williams, j. E. Banyard, National Physical Lab. (UK)
55
High-power semiconductor lasers for
lidar
and sensing applications
[2088-07]
M. C
Parries, A. C. Carter, T. J. Reid, GEC-Marconi Materials Technology (UK)
59
Performance tests of an angular scan LED array-based range-imaging sensor
[2088-08]
j. A. Marszalec, R.
A. Myllytó,
Technical Research Ctr. of Finland
69
Investigations of bimorph adaptive mirrors
[2088-10]
A. V. llcramov, I. M. Roshchupkm, A. G. Safronov, Firm TURN Ltd. (Russia)
SESSION
3
TRENDS
ÍN
INDUSTRIAL METROLOGY
82
Three-dimensional contouring by an optical radar system
[2088-11 ]
H.
Höfler,
G.
Schmidtke, Fraunhofer Institute
of Physical Measurement Techniques (FRG)
88
Spatial metrology using shaped laser beams
[2088-12]
B. Gorham, Univ. of East London {UK)
93
Two- and three-dimensional laser scanners for fast dimensional measurements and inspection
[2088-14]
W. D. van Amstel, R. j. Asjes, P. F. A. van
de Goor,
P.
Merkelbach,
Philips Ctr. for Manufacturing
Technology (Netherlands)
97
On-line inspection of textile geometries
{2088-15]
T.
Bahners,
W.
Ringens,
E.
Schollmeyer, Deutsches Textiiforschungszentrum Nord-West
eV (FRG)
SPIE
Vol.
2088
I
ìli
104
Fibre
optic shape-measuring system using phase-stepping speckle-pattern
interferometry
{2088-17]
L.
S.
Wang,
В.
N.
Dobbins,
K.
Jambunathan, Nottingham Trent Univ. (UK); X. P. Wu,
Univ. of Science and Technology of China
111
Automated calibration equipment for machine tools
[2088-16]
G. D.
Pitt, Leeds Univ. and Renishaw pic (UK)
121
laser radar-based measuring systems for large scale assembly applications
[2088-18]
I. Kaisto, Prometrics Ltd. (Finland); J. T. Kostamovaara, Univ. of Oulu (Finland); M. Manninen,
Prometrics Ltd. (Finland);
R. A.
Myllylä,
Technical Research Ctr. of Finland
132
Instruments for the automatic measurement of radius of curvature
[2088-19]
K, R. Manning,
Roke
Manor Research Ltd. (UK)
139
On-line particle size and velocity measurements by the analysis of defocused images: extended
depth of field
[2088-33]
D. Lebrun,
С.
Ozkul,
C. E.
Touil,
J. B. Blaisot, Univ.
de Rouen (France); A.
Kleta, EDF
Direction
des Etudes et Recherches (France)
SESSION
4
NANOMETROLOGV APPLICATIONS
_____________________________________________________
150
Subnanometre precision closed-loop positioning for optics and X-Y stage control using
capacitance displacement sensors and piezo-electric actuators
[2088-21]
N.
K. Reay,
Queensgate
Instruments Ltd. (UK)
160
Novel algorithm for comparative measurement of submicrometre features on photomasks
[2088-22]
J. W. Nunn, National Physical Lab. (UK); P. Salmon, King s College London (UK)
170
Absolute noncontacting method to characterize x-ray mirrors with large radii with nanometre
accuracy
[2088-24]
M. Virdee, National Physical Lab. (UK)
175
New design of an optical profiler
[2088-26]
J. A. Meiling,
Micromap
Corp. (USA); S. Coles, Burleigh Instruments (UK)
179
Measurement of the linear thermal expansion coefficient of gauge blocks by
interferometry
[2088-28]
E. B.
Hughes, National Physical Lab. (UK)
190
High-speed optical measurement of
3D
surfaces
[2088-29]
A. J. C. Brown, UBM
Messtechnik
GmbH (FRG)
195
New
interferometrie
profiler for smooth and rough surfaces
[2088-32]
P. j. Caber, S. j.
Martinek,
R. J.
Niemann,
WYKO
Corp. (USA)
SESSION
5
POSTER SESSION
206
New concept of optical superresolution
[2088-23]
V. P. Tychinsky, A. Odintsov, Moscow Institute for Radio Engineering, Electronics, and
Automation (Russia)
iv /
SPIE
Vo/.
2088
211
Dispersion-free Fabry-Perot interferometer for measuring very small displacements
[2088-31]
Yu. V. Troitski, Institute of Automation and Electrometry (Russia)
216
Author Index
SPIE
Vol.
2088 lv
|
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| genre_facet | Konferenzschrift 1993 Brighton Lasermaßtechnik |
| id | DE-604.BV010075710 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:46:04Z |
| institution | BVB |
| isbn | 0819413593 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006686975 |
| oclc_num | 301482461 |
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| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | IX, 216 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | SPIE, Internat. Soc. for Optical Engineering |
| record_format | marc |
| series | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| series2 | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| spelling | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom M. J. Downs, chair Bellingham, Wash. SPIE, Internat. Soc. for Optical Engineering 1994 IX, 216 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 2088 (DE-588)1071861417 Konferenzschrift 1993 Brighton gnd-content Lasermaßtechnik gnd rswk-swf Lasermaßtechnik f DE-604 Downs, M. J. Sonstige oth Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 2088 (DE-604)BV000010887 2088 Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006686975&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| subject_GND | (DE-588)1071861417 |
| title | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom |
| title_auth | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom |
| title_exact_search | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom |
| title_full | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom M. J. Downs, chair |
| title_fullStr | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom M. J. Downs, chair |
| title_full_unstemmed | Laser dimensional metrology recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom M. J. Downs, chair |
| title_short | Laser dimensional metrology |
| title_sort | laser dimensional metrology recent advances for industrial application 5 7 october 1993 brighton united kingdom |
| title_sub | recent advances for industrial application ; 5 - 7 October 1993, Brighton, United Kingdom |
| topic_facet | Konferenzschrift 1993 Brighton Lasermaßtechnik |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006686975&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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