25th anniversary compendium of papers from International Test Conference: 1970 - 1994
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. IEEE Computer Society Press 1994
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Physical Description:XV, 794 S.
ISBN:081866617X

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!