25th anniversary compendium of papers from International Test Conference: 1970 - 1994
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif.
IEEE Computer Society Press
1994
|
| Schlagworte: | |
| Beschreibung: | XV, 794 S. |
| ISBN: | 081866617X |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV010025387 | ||
| 003 | DE-604 | ||
| 005 | 20090918 | ||
| 007 | t | ||
| 008 | 950206s1994 |||| 10||| eng d | ||
| 020 | |a 081866617X |9 0-8186-6617-X | ||
| 035 | |a (OCoLC)31440992 | ||
| 035 | |a (DE-599)BVBBV010025387 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-91 | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.39/5/0287 |2 20 | |
| 084 | |a ELT 238f |2 stub | ||
| 084 | |a ELT 359f |2 stub | ||
| 245 | 1 | 0 | |a 25th anniversary compendium of papers from International Test Conference |b 1970 - 1994 |c ed. by H. Bardell ... |
| 264 | 1 | |a Los Alamitos, Calif. |b IEEE Computer Society Press |c 1994 | |
| 300 | |a XV, 794 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electronic digital computers |x Circuits |x Testing |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
| 689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Bardell, Paul H. |e Sonstige |4 oth | |
| 711 | 2 | |a International Test Conference |j Sonstige |0 (DE-588)212658-8 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006647493 | ||
Datensatz im Suchindex
| _version_ | 1804124405818720256 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV010025387 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 238f ELT 359f |
| ctrlnum | (OCoLC)31440992 (DE-599)BVBBV010025387 |
| dewey-full | 621.39/5/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5/0287 |
| dewey-search | 621.39/5/0287 |
| dewey-sort | 3621.39 15 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01502nam a2200421 c 4500</leader><controlfield tag="001">BV010025387</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090918 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">950206s1994 |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">081866617X</subfield><subfield code="9">0-8186-6617-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)31440992</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV010025387</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5/0287</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 238f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">25th anniversary compendium of papers from International Test Conference</subfield><subfield code="b">1970 - 1994</subfield><subfield code="c">ed. by H. Bardell ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif.</subfield><subfield code="b">IEEE Computer Society Press</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XV, 794 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="x">Circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bardell, Paul H.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)212658-8</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006647493</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Aufsatzsammlung Konferenzschrift |
| id | DE-604.BV010025387 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:45:09Z |
| institution | BVB |
| institution_GND | (DE-588)212658-8 |
| isbn | 081866617X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006647493 |
| oclc_num | 31440992 |
| open_access_boolean | |
| owner | DE-29T DE-91 DE-BY-TUM |
| owner_facet | DE-29T DE-91 DE-BY-TUM |
| physical | XV, 794 S. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | IEEE Computer Society Press |
| record_format | marc |
| spelling | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 ed. by H. Bardell ... Los Alamitos, Calif. IEEE Computer Society Press 1994 XV, 794 S. txt rdacontent n rdamedia nc rdacarrier Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content (DE-588)1071861417 Konferenzschrift gnd-content Elektronische Schaltung (DE-588)4113419-9 s Testen (DE-588)4367264-4 s DE-604 Bardell, Paul H. Sonstige oth International Test Conference Sonstige (DE-588)212658-8 oth |
| spellingShingle | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4113419-9 (DE-588)4143413-4 (DE-588)1071861417 |
| title | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 |
| title_auth | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 |
| title_exact_search | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 |
| title_full | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 ed. by H. Bardell ... |
| title_fullStr | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 ed. by H. Bardell ... |
| title_full_unstemmed | 25th anniversary compendium of papers from International Test Conference 1970 - 1994 ed. by H. Bardell ... |
| title_short | 25th anniversary compendium of papers from International Test Conference |
| title_sort | 25th anniversary compendium of papers from international test conference 1970 1994 |
| title_sub | 1970 - 1994 |
| topic | Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| topic_facet | Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen Elektronische Schaltung Aufsatzsammlung Konferenzschrift |
| work_keys_str_mv | AT bardellpaulh 25thanniversarycompendiumofpapersfrominternationaltestconference19701994 AT internationaltestconference 25thanniversarycompendiumofpapersfrominternationaltestconference19701994 |