Optical characterization of semiconductors: infrared, Raman, and photoluminescence spectroscopy
Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London u.a.
Acad. Press
1993
|
| Schriftenreihe: | Techniques of physics
14 |
| Schlagworte: | |
| Zusammenfassung: | Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique |
| Beschreibung: | X, 220 S. graph. Darst. |
| ISBN: | 0125507704 |
Internformat
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| 264 | 1 | |a London u.a. |b Acad. Press |c 1993 | |
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| 490 | 1 | |a Techniques of physics |v 14 | |
| 520 | 3 | |a Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors | |
| 520 | |a There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering | ||
| 520 | |a Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique | ||
| 650 | 4 | |a Semiconductors |x Testing |x Optical methods | |
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| author | Perkowitz, Sidney |
| author_GND | (DE-588)142778990 |
| author_facet | Perkowitz, Sidney |
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| building | Verbundindex |
| bvnumber | BV009931118 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UP 8000 UP 9000 |
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| ctrlnum | (OCoLC)29540358 (DE-599)BVBBV009931118 |
| dewey-full | 621.3815/2/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2/0287 |
| dewey-search | 621.3815/2/0287 |
| dewey-sort | 3621.3815 12 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV009931118 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:43:25Z |
| institution | BVB |
| isbn | 0125507704 |
| language | English |
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| oclc_num | 29540358 |
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| owner_facet | DE-91 DE-BY-TUM DE-634 |
| physical | X, 220 S. graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Acad. Press |
| record_format | marc |
| series | Techniques of physics |
| series2 | Techniques of physics |
| spelling | Perkowitz, Sidney Verfasser (DE-588)142778990 aut Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz London u.a. Acad. Press 1993 X, 220 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Techniques of physics 14 Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Spektroskopie (DE-588)4056138-0 s DE-604 Techniques of physics 14 (DE-604)BV001890126 14 |
| spellingShingle | Perkowitz, Sidney Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Techniques of physics Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4056138-0 |
| title | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_auth | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_exact_search | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_full | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_fullStr | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_full_unstemmed | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_short | Optical characterization of semiconductors |
| title_sort | optical characterization of semiconductors infrared raman and photoluminescence spectroscopy |
| title_sub | infrared, Raman, and photoluminescence spectroscopy |
| topic | Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| topic_facet | Semiconductors Testing Optical methods Halbleiter Spektroskopie |
| volume_link | (DE-604)BV001890126 |
| work_keys_str_mv | AT perkowitzsidney opticalcharacterizationofsemiconductorsinfraredramanandphotoluminescencespectroscopy |