Secure testing of VLSI cryptographic equipment:
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Bibliographic Details
Main Author: Bonnenberg, Heinz (Author)
Format: Microfilm Book
Language:English
Published: 1993
Subjects:
Item Description:Zürich, Eidgenössische Techn. Hochsch., Diss., - Mikroreprod. e. Ms. XV, 123 S. : Ill., graph. Darst.
Physical Description:2 Mikrofiches 24x

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!