Microanalysis of solids:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Plenum Press
1994
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| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIII, 460 S. zahlr. Ill. und graph. Darst. |
| ISBN: | 030644433X |
Internformat
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| 245 | 1 | 0 | |a Microanalysis of solids |c ed. by B. G. Yacobi ... |
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| 650 | 7 | |a Microanalyse |2 gtt | |
| 650 | 4 | |a Microchimie | |
| 650 | 7 | |a Microchimie |2 ram | |
| 650 | 4 | |a Solides - Analyse | |
| 650 | 7 | |a Solides - Analyse |2 ram | |
| 650 | 4 | |a Microchemistry | |
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Datensatz im Suchindex
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| adam_text | MICROANALYSIS OF SOLIDS EDITED BY B.G. YACOBI EMTECH TORONTO, ONTARIO,
CANADA D.B. HOLT IMPERIAL COLLEGE LONDON, ENGLAND AND L.L. KAZMERSKI
NATIONAL RENEWABLE ENERGY LABORATORY GOLDEN, COLORADO PLENUM PRESS * NEW
YORK AND LONDON CONTENTS PART I. INTRODUCTION 1. AN INTRODUCTION TO
MICROANALYSIS OF SOLIDS B. G. YACOBI AND D. B. HOLT 1.1. INTRODUCTION 3
1.2. ELECTRON BEAM TECHNIQUES 6 1.3. ION BEAM TECHNIQUES 9 1.4. PHOTON
BEAM TECHNIQUES 10 1.5. ACOUSTIC WAVE EXCITATION 14 1.6. TUNNELING OF
ELECTRONS AND SCANNING PROBE MICROSCOPIES 14 1.7. EMERGING TECHNIQUES 16
REFERENCES 21 PART II. ELECTRON BEAM TECHNIQUES 2. SCANNING ELECTRON
MICROSCOPY B. G. YACOBI AND D. B. HOLT 2. 1 . INTRODUCTION TO BASIC
PRINCIPLES 25 2.2. INTERACTION OF ELECTRONS WITH SOLIDS 29 2.3. THE
EMISSIVE MODE 36 2.4. TRANSMITTED ELECTRONS 42 2.5. THE X-RAY MODE 44
2.6. CATHODOLUMINESCENCE MODE 45 2.7. THE CHARGE-COLLECTION MODE 51 2.8.
THE ELECTRON ACOUSTIC MODE 57 2.9. SCANNING DEEP-LEVEL TRANSIENT
SPECTROSCOPY 57 2.10. CONCLUSIONS 60 BIBLIOGRAPHY 60 REFERENCES 61 IX X
CONTENTS 3. TRANSMISSION ELECTRON MICROSCOPY A. J. GARRATT-REED 3.1.
INTRODUCTION 65 3.2. FUNDAMENTALS 66 3.3. INTERACTION OF ELECTRONS WITH
MATTER, AND CONTRAST 67 3.4. CONSTRUCTION DETAILS 75 3.5. MICROANALYSIS
87 3.6. EXAMPLES 92 3.7. FINAL COMMENTS AND FUTURE TRENDS 95 3.8.
FURTHER READING 97 4. AUGER ELECTRON SPECTROSCOPY L. L. KAZMERSKI 4.1.
INTRODUCTION AND BACKGROUND 99 4.2. FUNDAMENTAL PRINCIPLES 100 4.3.
EXPERIMENTAL METHODS AND INSTRUMENTATION ILL 4.4. SCANNING AUGER
ELECTRON SPECTROSCOPY 120 4.5. CHEMICAL ANALYSIS 126 4.6. SPUTTERING AND
DEPTH PROFILES 129 4.7. QUANTITATIVE ANALYSIS 135 4.8. SUMMARY 141
REFERENCES 142 PART III. ION BEAM TECHNIQUES 5. SECONDARY ION MASS
SPECTROMETRY 5. E. ASHER 5.1. INTRODUCTION 149 5.2. TECHNIQUE 150 5.3.
QUANTITATIVE ANALYSIS 159 5.4. SENSITIVITY AND RESOLUTION 162 5.5.
EXPERIMENTAL EXAMPLES 166 5.6. RELATED TECHNIQUES 169 5.7. FUTURE TRENDS
173 REFERENCES 175 CONTENTS XI 6. APPLICATIONS OF MEGAELECTRON-VOLT ION
BEAMS IN MATERIALS ANALYSIS P. REVESZ AND J. LI 6.1. INTRODUCTION TO
RUTHERFORD BACKSCATTENNG 179 6.2. PHYSICAL PRINCIPLES OF BACKSCATTERING
181 6.3. FORWARD RECOIL ELASTIC SCATTERING 197 6.4. CHANNELING 199 6.5.
ELASTIC RESONANCES 203 6.6. PARTICLE-INDUCED X-RAY EMISSION 211 6.7.
CONCLUSIONS 213 REFERENCES 215 PART IV. PHOTON BEAM TECHNIQUES 7.
CONFOCAL MICROSCOPY T. WILSON 7.1. INTRODUCTION 219 7.2. THE CONFOCAL
OPTICAL SYSTEM 220 7.3. ALTERNATIVE FORMS OF DETECTOR 226 7.4.
CONCLUSIONS 230 REFERENCES 231 8. X-RAY MICROSCOPY A. G. MICHETTE AND A.
W. POTTS 8.1. INTRODUCTION 233 8.2. X-RAY SOURCES 235 8.3. X-RAY OPTICS
236 8.4. X-RAY MICROSCOPES 237 8.5. APPLICATIONS 240 8.6. THE FUTURE 244
REFERENCES 245 9. X-RAY PHOTOEMISSION SPECTROSCOPY A. J. NELSON 9.1.
INTRODUCTION AND BACKGROUND 247 9.2. FUNDAMENTAL PRINCIPLES 248 XII
CONTENTS 9.3. EXPERIMENTAL CONSIDERATIONS 253 9.4. QUANTITATIVE XPS 264
9.5. SUMMARY 266 REFERENCES 266 10. LASER IONIZATION MASS SPECTROMETRY
R. W. ODOM AND F. RADICATI DI BROZOLO 10.1. INTRODUCTION 269 10.2.
INSTRUMENTATION 270 10.3. APPLICATIONS 273 10.4. BULK ANALYSIS 274 10.5.
SURFACE ANALYSIS 275 10.6. LASER POSTIONIZATION 277 10.7. POLYMER
ANALYSIS 280 REFERENCES 283 11. MICROELLIPSOMETRY R. F. COHN 11.1.
INTRODUCTION 285 11.2. PRINCIPLES OF ELLIPSOMETRY 286 11.3.
MICROELLIPSOMETRY 299 11.4. APPLICATIONS OF MICROELLIPSOMETRY 308 11.5.
CONCLUSIONS 319 REFERENCES 320 PART V. ACOUSTIC WAVE EXCITATION 12.
SCANNING ACOUSTIC MICROSCOPY P. MUTTI AND G. A.D. BRIGGS 12.1.
INTRODUCTION 327 12.2. THE SCANNING ACOUSTIC MICROSCOPE 328 12.3.
CONTRAST THEORY 333 12.4. SURFACE ACOUSTIC WAVES IN SOLIDS 337 12.5.
QUANTITATIVE ACOUSTIC MICROSCOPY 338 CONTENTS XIII 12.6. ACOUSTIC IMAGES
OF MATERIALS 341 12.7. CONCLUSIONS 350 REFERENCES 353 PART VI. TUNNELING
OF ELECTRONS AND SCANNING PROBE MICROSCOPIES 13. FIELD EMISSION, FIELD
ION MICROSCOPY, AND THE ATOM PROBE ./. J. HREN AND J. LIU 13.1.
INTRODUCTION 359 13.2. FIELD ELECTRON EMISSION 360 13.3. FIELD ION
MICROSCOPY 371 REFERENCES 386 14. SCANNING PROBE MICROSCOPY D. A. GRIGG
AND P. E. RUSSELL 14.1. INTRODUCTION TO SCANNING PROBE MICROSOCPY 389
14.2. THE ULTRAMICROMETER 390 14.3. THE TOPOGRAFINER 394 14.4. THE
SCANNING TUNNELING MICROSCOPE 399 14.5. INSTRUMENTATION 406 14.6. STM
THEORY 428 14.7. SCANNING FORCE MICROSCOPE 430 14.8. MAGNETIC FORCE
MICROSCOPE 438 14.9. SCANNING CAPACITANCE MICROSCOPE 439 14.10.
NEAR-FIELD SCANNING OPTICAL MICROSCOPE 440 14.11. FUTURE TRENDS 444
REFERENCES 444 INDEX 449
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| indexdate | 2024-07-09T17:42:35Z |
| institution | BVB |
| isbn | 030644433X |
| language | English |
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| physical | XIII, 460 S. zahlr. Ill. und graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Plenum Press |
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| spelling | Microanalysis of solids ed. by B. G. Yacobi ... New York [u.a.] Plenum Press 1994 XIII, 460 S. zahlr. Ill. und graph. Darst. txt rdacontent n rdamedia nc rdacarrier Chimie de l'état solide ram Microanalyse gtt Microchimie Microchimie ram Solides - Analyse Solides - Analyse ram Microchemistry Solids Analysis Festkörper (DE-588)4016918-2 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Festkörper (DE-588)4016918-2 s Mikroanalyse (DE-588)4169804-6 s DE-604 Yacobi, B. G. edt GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006546175&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Microanalysis of solids Chimie de l'état solide ram Microanalyse gtt Microchimie Microchimie ram Solides - Analyse Solides - Analyse ram Microchemistry Solids Analysis Festkörper (DE-588)4016918-2 gnd Mikroanalyse (DE-588)4169804-6 gnd |
| subject_GND | (DE-588)4016918-2 (DE-588)4169804-6 |
| title | Microanalysis of solids |
| title_auth | Microanalysis of solids |
| title_exact_search | Microanalysis of solids |
| title_full | Microanalysis of solids ed. by B. G. Yacobi ... |
| title_fullStr | Microanalysis of solids ed. by B. G. Yacobi ... |
| title_full_unstemmed | Microanalysis of solids ed. by B. G. Yacobi ... |
| title_short | Microanalysis of solids |
| title_sort | microanalysis of solids |
| topic | Chimie de l'état solide ram Microanalyse gtt Microchimie Microchimie ram Solides - Analyse Solides - Analyse ram Microchemistry Solids Analysis Festkörper (DE-588)4016918-2 gnd Mikroanalyse (DE-588)4169804-6 gnd |
| topic_facet | Chimie de l'état solide Microanalyse Microchimie Solides - Analyse Microchemistry Solids Analysis Festkörper Mikroanalyse |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006546175&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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