Electromigration and electronic device degradation:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY u.a.
Wiley
1994
|
| Schriftenreihe: | A Wiley interscience publication
|
| Schlagworte: | |
| Beschreibung: | XIV, 343 S. Ill., graph. Darst. |
| ISBN: | 0471584894 |
Internformat
MARC
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| 245 | 1 | 0 | |a Electromigration and electronic device degradation |c ed. by Aris Christou |
| 264 | 1 | |a New York, NY u.a. |b Wiley |c 1994 | |
| 300 | |a XIV, 343 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a A Wiley interscience publication | |
| 650 | 4 | |a Electrodiffusion | |
| 650 | 4 | |a Integrated circuits |x Deterioration | |
| 650 | 4 | |a Semiconductors |x Failures | |
| 650 | 0 | 7 | |a Elektromigration |0 (DE-588)4296761-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Degradation |g Technik |0 (DE-588)4206992-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |2 gnd |9 rswk-swf |
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| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Christou, Aris |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| dewey-sort | 3621.3815 |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV009758017 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:40:22Z |
| institution | BVB |
| isbn | 0471584894 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006454762 |
| oclc_num | 27771020 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-83 |
| physical | XIV, 343 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley interscience publication |
| spelling | Electromigration and electronic device degradation ed. by Aris Christou New York, NY u.a. Wiley 1994 XIV, 343 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley interscience publication Electrodiffusion Integrated circuits Deterioration Semiconductors Failures Elektromigration (DE-588)4296761-2 gnd rswk-swf Degradation Technik (DE-588)4206992-0 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Elektromigration (DE-588)4296761-2 s DE-604 Degradation Technik (DE-588)4206992-0 s Elektronisches Bauelement (DE-588)4014360-0 s Christou, Aris Sonstige oth |
| spellingShingle | Electromigration and electronic device degradation Electrodiffusion Integrated circuits Deterioration Semiconductors Failures Elektromigration (DE-588)4296761-2 gnd Degradation Technik (DE-588)4206992-0 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4296761-2 (DE-588)4206992-0 (DE-588)4014360-0 |
| title | Electromigration and electronic device degradation |
| title_auth | Electromigration and electronic device degradation |
| title_exact_search | Electromigration and electronic device degradation |
| title_full | Electromigration and electronic device degradation ed. by Aris Christou |
| title_fullStr | Electromigration and electronic device degradation ed. by Aris Christou |
| title_full_unstemmed | Electromigration and electronic device degradation ed. by Aris Christou |
| title_short | Electromigration and electronic device degradation |
| title_sort | electromigration and electronic device degradation |
| topic | Electrodiffusion Integrated circuits Deterioration Semiconductors Failures Elektromigration (DE-588)4296761-2 gnd Degradation Technik (DE-588)4206992-0 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Electrodiffusion Integrated circuits Deterioration Semiconductors Failures Elektromigration Degradation Technik Elektronisches Bauelement |
| work_keys_str_mv | AT christouaris electromigrationandelectronicdevicedegradation |