Integrating reliability into microelectronics manufacturing:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester u.a.
Wiley
1994
|
| Schriftenreihe: | Design and measurement in electronic engineering
|
| Schlagworte: | |
| Beschreibung: | XII, 349 S. Ill., graph. Darst. |
| ISBN: | 0471944076 |
Internformat
MARC
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| 245 | 1 | 0 | |a Integrating reliability into microelectronics manufacturing |c Aris Christou |
| 264 | 1 | |a Chichester u.a. |b Wiley |c 1994 | |
| 300 | |a XII, 349 S. |b Ill., graph. Darst. | ||
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| 650 | 4 | |a Integrated circuits |x Reliability | |
| 650 | 4 | |a Microelectronics |x Quality control | |
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Datensatz im Suchindex
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| author | Christou, Aris |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV009754059 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:40:17Z |
| institution | BVB |
| isbn | 0471944076 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006451326 |
| oclc_num | 29357303 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-634 |
| owner_facet | DE-91 DE-BY-TUM DE-634 |
| physical | XII, 349 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Wiley |
| record_format | marc |
| series2 | Design and measurement in electronic engineering |
| spelling | Christou, Aris Verfasser aut Integrating reliability into microelectronics manufacturing Aris Christou Chichester u.a. Wiley 1994 XII, 349 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Design and measurement in electronic engineering Circuitos integrados larpcal Confiabilidade (engenharia eletrica) larpcal Controle de qualidade larpcal Integrated circuits Reliability Microelectronics Quality control Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 gnd rswk-swf Halbleitertechnologie (DE-588)4158814-9 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 |
| spellingShingle | Christou, Aris Integrating reliability into microelectronics manufacturing Circuitos integrados larpcal Confiabilidade (engenharia eletrica) larpcal Controle de qualidade larpcal Integrated circuits Reliability Microelectronics Quality control Zuverlässigkeit (DE-588)4059245-5 gnd Halbleitertechnologie (DE-588)4158814-9 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4158814-9 |
| title | Integrating reliability into microelectronics manufacturing |
| title_auth | Integrating reliability into microelectronics manufacturing |
| title_exact_search | Integrating reliability into microelectronics manufacturing |
| title_full | Integrating reliability into microelectronics manufacturing Aris Christou |
| title_fullStr | Integrating reliability into microelectronics manufacturing Aris Christou |
| title_full_unstemmed | Integrating reliability into microelectronics manufacturing Aris Christou |
| title_short | Integrating reliability into microelectronics manufacturing |
| title_sort | integrating reliability into microelectronics manufacturing |
| topic | Circuitos integrados larpcal Confiabilidade (engenharia eletrica) larpcal Controle de qualidade larpcal Integrated circuits Reliability Microelectronics Quality control Zuverlässigkeit (DE-588)4059245-5 gnd Halbleitertechnologie (DE-588)4158814-9 gnd |
| topic_facet | Circuitos integrados Confiabilidade (engenharia eletrica) Controle de qualidade Integrated circuits Reliability Microelectronics Quality control Zuverlässigkeit Halbleitertechnologie |
| work_keys_str_mv | AT christouaris integratingreliabilityintomicroelectronicsmanufacturing |