Wacker's atlas for characterization of defects in silicon:
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Bibliographic Details
Main Author: Rauh, Herbert (Author)
Format: Book
Language:Undetermined
Published: Burghausen Wacker-Chemitronic GmbH [1989]
Subjects:
Physical Description:64 S. überw. Ill.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!