Scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Englewood Cliffs, NJ
Prentice Hall
1993
|
| Schlagworte: | |
| Beschreibung: | XIII, 458 S. Ill., graph. Darst. |
| ISBN: | 0138137595 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV009691099 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 940707s1993 ad|| |||| 00||| eng d | ||
| 020 | |a 0138137595 |9 0-13-813759-5 | ||
| 035 | |a (OCoLC)25049201 | ||
| 035 | |a (DE-599)BVBBV009691099 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-29 | ||
| 050 | 0 | |a QH212.S3 | |
| 082 | 0 | |a 502/.8/25 |2 20 | |
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 100 | 1 | |a Lee, Robert E. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Scanning electron microscopy and x-ray microanalysis |c Robert Edward Lee |
| 264 | 1 | |a Englewood Cliffs, NJ |b Prentice Hall |c 1993 | |
| 300 | |a XIII, 458 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Elektronenmicroscopie |2 gtt | |
| 650 | 7 | |a Microanalyse par émission X |2 ram | |
| 650 | 7 | |a Microscopie électronique à balayage |2 ram | |
| 650 | 7 | |a Röntgen-microanalyse |2 gtt | |
| 650 | 4 | |a Electron Probe Microanalysis | |
| 650 | 4 | |a Microscopy, Electron, Scanning | |
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 4 | |a X-ray microanalysis | |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 1 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006409004 | ||
Datensatz im Suchindex
| _version_ | 1804124036119134208 |
|---|---|
| any_adam_object | |
| author | Lee, Robert E. |
| author_facet | Lee, Robert E. |
| author_role | aut |
| author_sort | Lee, Robert E. |
| author_variant | r e l re rel |
| building | Verbundindex |
| bvnumber | BV009691099 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S3 |
| callnumber-search | QH212.S3 |
| callnumber-sort | QH 3212 S3 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6310 |
| ctrlnum | (OCoLC)25049201 (DE-599)BVBBV009691099 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01556nam a2200457 c 4500</leader><controlfield tag="001">BV009691099</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940707s1993 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0138137595</subfield><subfield code="9">0-13-813759-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)25049201</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009691099</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-29</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.S3</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Lee, Robert E.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning electron microscopy and x-ray microanalysis</subfield><subfield code="c">Robert Edward Lee</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Englewood Cliffs, NJ</subfield><subfield code="b">Prentice Hall</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 458 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Elektronenmicroscopie</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microanalyse par émission X</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopie électronique à balayage</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Röntgen-microanalyse</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron Probe Microanalysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron, Scanning</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-ray microanalysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006409004</subfield></datafield></record></collection> |
| id | DE-604.BV009691099 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:39:16Z |
| institution | BVB |
| isbn | 0138137595 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006409004 |
| oclc_num | 25049201 |
| open_access_boolean | |
| owner | DE-703 DE-29 |
| owner_facet | DE-703 DE-29 |
| physical | XIII, 458 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Prentice Hall |
| record_format | marc |
| spelling | Lee, Robert E. Verfasser aut Scanning electron microscopy and x-ray microanalysis Robert Edward Lee Englewood Cliffs, NJ Prentice Hall 1993 XIII, 458 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronenmicroscopie gtt Microanalyse par émission X ram Microscopie électronique à balayage ram Röntgen-microanalyse gtt Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s |
| spellingShingle | Lee, Robert E. Scanning electron microscopy and x-ray microanalysis Elektronenmicroscopie gtt Microanalyse par émission X ram Microscopie électronique à balayage ram Röntgen-microanalyse gtt Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4151898-6 (DE-588)4048455-5 |
| title | Scanning electron microscopy and x-ray microanalysis |
| title_auth | Scanning electron microscopy and x-ray microanalysis |
| title_exact_search | Scanning electron microscopy and x-ray microanalysis |
| title_full | Scanning electron microscopy and x-ray microanalysis Robert Edward Lee |
| title_fullStr | Scanning electron microscopy and x-ray microanalysis Robert Edward Lee |
| title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis Robert Edward Lee |
| title_short | Scanning electron microscopy and x-ray microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis |
| topic | Elektronenmicroscopie gtt Microanalyse par émission X ram Microscopie électronique à balayage ram Röntgen-microanalyse gtt Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Elektronenmicroscopie Microanalyse par émission X Microscopie électronique à balayage Röntgen-microanalyse Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse Rasterelektronenmikroskopie |
| work_keys_str_mv | AT leeroberte scanningelectronmicroscopyandxraymicroanalysis |