French-Japanese Seminar on In Situ Electron Microscopy: November 9 - 12, 1992, Nagoya, Japan
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Bibliographic Details
Corporate Author: French Japanese Seminar on In Situ Electron Microscopy Nagoya (Author)
Format: Conference Proceeding Book
Language:English
Published: Les Ulis Ed. de Physique 1993
Series:Microscopy, microanalysis, microstructures 4,2/3
Subjects:
Item Description:Einzelaufnahme eines Zs.-Heftes
Physical Description:S. 101 - 346 Ill., graph. Darst.

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