French-Japanese Seminar on In Situ Electron Microscopy: November 9 - 12, 1992, Nagoya, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Les Ulis
Ed. de Physique
1993
|
| Schriftenreihe: | Microscopy, microanalysis, microstructures
4,2/3 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zs.-Heftes |
| Beschreibung: | S. 101 - 346 Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV009657506 | ||
| 003 | DE-604 | ||
| 005 | 20000920 | ||
| 007 | t | ||
| 008 | 940615s1993 |||| 10||| engod | ||
| 035 | |a (OCoLC)35545541 | ||
| 035 | |a (DE-599)BVBBV009657506 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 | ||
| 111 | 2 | |a French Japanese Seminar on In Situ Electron Microscopy |d 1992 |c Nagoya |j Verfasser |0 (DE-588)5103601-0 |4 aut | |
| 245 | 1 | 0 | |a French-Japanese Seminar on In Situ Electron Microscopy |b November 9 - 12, 1992, Nagoya, Japan |c guest eds.: F. Louchet ... |
| 246 | 1 | 3 | |a Proceedings of the French-Japanese Seminar on In Situ Electron Microscopy |
| 264 | 1 | |a Les Ulis |b Ed. de Physique |c 1993 | |
| 300 | |a S. 101 - 346 |c Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Microscopy, microanalysis, microstructures |v 4,2/3 | |
| 500 | |a Einzelaufnahme eines Zs.-Heftes | ||
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a In situ |0 (DE-588)4293230-0 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1992 |z Nagoya |2 gnd-content | |
| 689 | 0 | 0 | |a In situ |0 (DE-588)4293230-0 |D s |
| 689 | 0 | 1 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Louchet, F. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006385133 | ||
Datensatz im Suchindex
| _version_ | 1804124000102645760 |
|---|---|
| any_adam_object | |
| author_corporate | French Japanese Seminar on In Situ Electron Microscopy Nagoya |
| author_corporate_role | aut |
| author_facet | French Japanese Seminar on In Situ Electron Microscopy Nagoya |
| author_sort | French Japanese Seminar on In Situ Electron Microscopy Nagoya |
| building | Verbundindex |
| bvnumber | BV009657506 |
| ctrlnum | (OCoLC)35545541 (DE-599)BVBBV009657506 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01399nam a2200361 cb4500</leader><controlfield tag="001">BV009657506</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20000920 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940615s1993 |||| 10||| engod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)35545541</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009657506</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">French Japanese Seminar on In Situ Electron Microscopy</subfield><subfield code="d">1992</subfield><subfield code="c">Nagoya</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5103601-0</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">French-Japanese Seminar on In Situ Electron Microscopy</subfield><subfield code="b">November 9 - 12, 1992, Nagoya, Japan</subfield><subfield code="c">guest eds.: F. Louchet ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of the French-Japanese Seminar on In Situ Electron Microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Les Ulis</subfield><subfield code="b">Ed. de Physique</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">S. 101 - 346</subfield><subfield code="c">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Microscopy, microanalysis, microstructures</subfield><subfield code="v">4,2/3</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zs.-Heftes</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1992</subfield><subfield code="z">Nagoya</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Louchet, F.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006385133</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1992 Nagoya gnd-content |
| genre_facet | Konferenzschrift 1992 Nagoya |
| id | DE-604.BV009657506 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:38:42Z |
| institution | BVB |
| institution_GND | (DE-588)5103601-0 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006385133 |
| oclc_num | 35545541 |
| open_access_boolean | |
| owner | DE-12 |
| owner_facet | DE-12 |
| physical | S. 101 - 346 Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Ed. de Physique |
| record_format | marc |
| series2 | Microscopy, microanalysis, microstructures |
| spelling | French Japanese Seminar on In Situ Electron Microscopy 1992 Nagoya Verfasser (DE-588)5103601-0 aut French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan guest eds.: F. Louchet ... Proceedings of the French-Japanese Seminar on In Situ Electron Microscopy Les Ulis Ed. de Physique 1993 S. 101 - 346 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microscopy, microanalysis, microstructures 4,2/3 Einzelaufnahme eines Zs.-Heftes Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf In situ (DE-588)4293230-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1992 Nagoya gnd-content In situ (DE-588)4293230-0 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Louchet, F. Sonstige oth |
| spellingShingle | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan Elektronenmikroskopie (DE-588)4014327-2 gnd In situ (DE-588)4293230-0 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4293230-0 (DE-588)1071861417 |
| title | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan |
| title_alt | Proceedings of the French-Japanese Seminar on In Situ Electron Microscopy |
| title_auth | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan |
| title_exact_search | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan |
| title_full | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan guest eds.: F. Louchet ... |
| title_fullStr | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan guest eds.: F. Louchet ... |
| title_full_unstemmed | French-Japanese Seminar on In Situ Electron Microscopy November 9 - 12, 1992, Nagoya, Japan guest eds.: F. Louchet ... |
| title_short | French-Japanese Seminar on In Situ Electron Microscopy |
| title_sort | french japanese seminar on in situ electron microscopy november 9 12 1992 nagoya japan |
| title_sub | November 9 - 12, 1992, Nagoya, Japan |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd In situ (DE-588)4293230-0 gnd |
| topic_facet | Elektronenmikroskopie In situ Konferenzschrift 1992 Nagoya |
| work_keys_str_mv | AT frenchjapaneseseminaroninsituelectronmicroscopynagoya frenchjapaneseseminaroninsituelectronmicroscopynovember9121992nagoyajapan AT louchetf frenchjapaneseseminaroninsituelectronmicroscopynovember9121992nagoyajapan AT frenchjapaneseseminaroninsituelectronmicroscopynagoya proceedingsofthefrenchjapaneseseminaroninsituelectronmicroscopy AT louchetf proceedingsofthefrenchjapaneseseminaroninsituelectronmicroscopy |