X-ray microscopy: proceedings of the international symposium, Brookhaven, NY, August 31 - September 4, 1987
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Bibliographic Details
Format: Conference Proceeding Book
Language:Undetermined
Published: Berlin u.a. Springer 1988
Series:Springer series in optical sciences 56
Subjects:
Physical Description:XIV, 454 S. graph. Darst.
ISBN:3540193928
0387193928

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