Proceedings: Boston, Mass., 16 - 21 August 1992 2
Gespeichert in:
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Format: | Buch |
Sprache: | Undetermined |
Veröffentlicht: |
San Francisco, CA
San Francisco Press
(1992)
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Beschreibung: | LV S., S. 936 - 1789 Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 cc4500 | ||
---|---|---|---|
001 | BV009559836 | ||
003 | DE-604 | ||
007 | t | ||
008 | 940429s1992 ad|| |||| 10||| und d | ||
035 | |a (OCoLC)165118838 | ||
035 | |a (DE-599)BVBBV009559836 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-12 | ||
110 | 2 | |a Electron Microscopy Society of America |e Verfasser |0 (DE-588)1033501-8 |4 aut | |
245 | 1 | 0 | |a Proceedings |b Boston, Mass., 16 - 21 August 1992 |n 2 |c Fiftieth Annual Meeting, Electron Microscopy Society of America ; Twenty-Seventh Annual Meeting, Microbeam Analysis Society ; Nineteenth Annual Meeting, Microscopial Society of Canada ; ed.: G. W. Bailey ... |
264 | 1 | |a San Francisco, CA |b San Francisco Press |c (1992) | |
300 | |a LV S., S. 936 - 1789 |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
700 | 1 | |a Bailey, G. W. |e Sonstige |4 oth | |
773 | 0 | 8 | |w (DE-604)BV009559829 |g 2 |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-006316931 |
Datensatz im Suchindex
_version_ | 1806051805299212288 |
---|---|
adam_text | |
any_adam_object | |
author_corporate | Electron Microscopy Society of America |
author_corporate_role | aut |
author_facet | Electron Microscopy Society of America |
author_sort | Electron Microscopy Society of America |
building | Verbundindex |
bvnumber | BV009559836 |
ctrlnum | (OCoLC)165118838 (DE-599)BVBBV009559836 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 cc4500</leader><controlfield tag="001">BV009559836</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940429s1992 ad|| |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)165118838</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009559836</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">Electron Microscopy Society of America</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1033501-8</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">Boston, Mass., 16 - 21 August 1992</subfield><subfield code="n">2</subfield><subfield code="c">Fiftieth Annual Meeting, Electron Microscopy Society of America ; Twenty-Seventh Annual Meeting, Microbeam Analysis Society ; Nineteenth Annual Meeting, Microscopial Society of Canada ; ed.: G. W. Bailey ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">San Francisco, CA</subfield><subfield code="b">San Francisco Press</subfield><subfield code="c">(1992)</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">LV S., S. 936 - 1789</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bailey, G. W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV009559829</subfield><subfield code="g">2</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006316931</subfield></datafield></record></collection> |
id | DE-604.BV009559836 |
illustrated | Illustrated |
indexdate | 2024-07-31T00:20:20Z |
institution | BVB |
institution_GND | (DE-588)1033501-8 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006316931 |
oclc_num | 165118838 |
open_access_boolean | |
owner | DE-12 |
owner_facet | DE-12 |
physical | LV S., S. 936 - 1789 Ill., graph. Darst. |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | San Francisco Press |
record_format | marc |
spelling | Electron Microscopy Society of America Verfasser (DE-588)1033501-8 aut Proceedings Boston, Mass., 16 - 21 August 1992 2 Fiftieth Annual Meeting, Electron Microscopy Society of America ; Twenty-Seventh Annual Meeting, Microbeam Analysis Society ; Nineteenth Annual Meeting, Microscopial Society of Canada ; ed.: G. W. Bailey ... San Francisco, CA San Francisco Press (1992) LV S., S. 936 - 1789 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Bailey, G. W. Sonstige oth (DE-604)BV009559829 2 |
spellingShingle | Proceedings Boston, Mass., 16 - 21 August 1992 |
title | Proceedings Boston, Mass., 16 - 21 August 1992 |
title_auth | Proceedings Boston, Mass., 16 - 21 August 1992 |
title_exact_search | Proceedings Boston, Mass., 16 - 21 August 1992 |
title_full | Proceedings Boston, Mass., 16 - 21 August 1992 2 Fiftieth Annual Meeting, Electron Microscopy Society of America ; Twenty-Seventh Annual Meeting, Microbeam Analysis Society ; Nineteenth Annual Meeting, Microscopial Society of Canada ; ed.: G. W. Bailey ... |
title_fullStr | Proceedings Boston, Mass., 16 - 21 August 1992 2 Fiftieth Annual Meeting, Electron Microscopy Society of America ; Twenty-Seventh Annual Meeting, Microbeam Analysis Society ; Nineteenth Annual Meeting, Microscopial Society of Canada ; ed.: G. W. Bailey ... |
title_full_unstemmed | Proceedings Boston, Mass., 16 - 21 August 1992 2 Fiftieth Annual Meeting, Electron Microscopy Society of America ; Twenty-Seventh Annual Meeting, Microbeam Analysis Society ; Nineteenth Annual Meeting, Microscopial Society of Canada ; ed.: G. W. Bailey ... |
title_short | Proceedings |
title_sort | proceedings boston mass 16 21 august 1992 |
title_sub | Boston, Mass., 16 - 21 August 1992 |
volume_link | (DE-604)BV009559829 |
work_keys_str_mv | AT electronmicroscopysocietyofamerica proceedingsbostonmass1621august19922 AT baileygw proceedingsbostonmass1621august19922 |