Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy:
Saved in:
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
1993
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| Subjects: | |
| Item Description: | Aachen, Technische Hochsch., Diss., 1993 |
| Physical Description: | VII, 147 S. Ill., graph. Darst. |
Staff View
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Record in the Search Index
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| author_facet | Compañó Monte, Ramón |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T17:36:36Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006293593 |
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| physical | VII, 147 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
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| spelling | Compañó Monte, Ramón Verfasser aut Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy vorgelegt von Ramón Compañó Monte 1993 VII, 147 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Aachen, Technische Hochsch., Diss., 1993 Metall-Halbleiter-Kontakt (DE-588)4169590-2 gnd rswk-swf Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Metall-Halbleiter-Kontakt (DE-588)4169590-2 s Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 |
| spellingShingle | Compañó Monte, Ramón Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy Metall-Halbleiter-Kontakt (DE-588)4169590-2 gnd Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| subject_GND | (DE-588)4169590-2 (DE-588)4123130-2 (DE-588)4287503-1 (DE-588)4113937-9 |
| title | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy |
| title_auth | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy |
| title_exact_search | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy |
| title_full | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy vorgelegt von Ramón Compañó Monte |
| title_fullStr | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy vorgelegt von Ramón Compañó Monte |
| title_full_unstemmed | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy vorgelegt von Ramón Compañó Monte |
| title_short | Semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy |
| title_sort | semiconductor metal interfaces studied by high resolution electron energy loss spectroscopy |
| topic | Metall-Halbleiter-Kontakt (DE-588)4169590-2 gnd Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| topic_facet | Metall-Halbleiter-Kontakt Elektronen-Energieverlustspektroskopie Hochauflösendes Verfahren Hochschulschrift |
| work_keys_str_mv | AT companomonteramon semiconductormetalinterfacesstudiedbyhighresolutionelectronenergylossspectroscopy |