Secondary ion mass spectrometry: proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry 4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S.
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Berlin
Springer
1984
|
| Schriftenreihe: | Springer series in chemical physics
36 |
| Schlagworte: |
Internformat
MARC
| LEADER | 00000nam a2200000 cc4500 | ||
|---|---|---|---|
| 001 | BV009387211 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 940401s1984 |||| 10||| und d | ||
| 035 | |a (OCoLC)634415436 | ||
| 035 | |a (DE-599)BVBBV009387211 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-29T | ||
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry |n 4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S. |c Urheber: SIMS* |
| 264 | 1 | |a Berlin |b Springer |c 1984 | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in chemical physics |v 36 | |
| 490 | 0 | |a Springer series in chemical physics |v ... | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 711 | 2 | |a SIMS |j Sonstige |0 (DE-588)244977-8 |4 oth | |
| 773 | 0 | 8 | |w (DE-604)BV009387208 |g 4 |
| 830 | 0 | |a Springer series in chemical physics |v 36 |w (DE-604)BV000000670 |9 36 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006228434 | ||
Datensatz im Suchindex
| _version_ | 1804123790859304960 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV009387211 |
| ctrlnum | (OCoLC)634415436 (DE-599)BVBBV009387211 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01045nam a2200289 cc4500</leader><controlfield tag="001">BV009387211</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940401s1984 |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634415436</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009387211</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Secondary ion mass spectrometry</subfield><subfield code="b">proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry</subfield><subfield code="n">4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S.</subfield><subfield code="c">Urheber: SIMS*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Springer</subfield><subfield code="c">1984</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer series in chemical physics</subfield><subfield code="v">36</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer series in chemical physics</subfield><subfield code="v">...</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">SIMS</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)244977-8</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV009387208</subfield><subfield code="g">4</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer series in chemical physics</subfield><subfield code="v">36</subfield><subfield code="w">(DE-604)BV000000670</subfield><subfield code="9">36</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006228434</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV009387211 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:35:22Z |
| institution | BVB |
| institution_GND | (DE-588)244977-8 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006228434 |
| oclc_num | 634415436 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| publishDate | 1984 |
| publishDateSearch | 1984 |
| publishDateSort | 1984 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry 4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S. Urheber: SIMS* Berlin Springer 1984 txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 36 Springer series in chemical physics ... (DE-588)1071861417 Konferenzschrift gnd-content SIMS Sonstige (DE-588)244977-8 oth (DE-604)BV009387208 4 Springer series in chemical physics 36 (DE-604)BV000000670 36 |
| spellingShingle | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry Springer series in chemical physics |
| subject_GND | (DE-588)1071861417 |
| title | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry |
| title_auth | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry |
| title_exact_search | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry |
| title_full | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry 4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S. Urheber: SIMS* |
| title_fullStr | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry 4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S. Urheber: SIMS* |
| title_full_unstemmed | Secondary ion mass spectrometry proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry 4. Osaka, Japan, Nov. 13 - 19,1983. - 1984. - XV, 503 S. Urheber: SIMS* |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry proceedings of the internat conf on secondary ion mass spectrometry |
| title_sub | proceedings of the Internat. Conf. on Secondary Ion Mass Spectrometry |
| topic_facet | Konferenzschrift |
| volume_link | (DE-604)BV009387208 (DE-604)BV000000670 |
| work_keys_str_mv | AT sims secondaryionmassspectrometryproceedingsoftheinternatconfonsecondaryionmassspectrometry4osakajapannov131919831984xv503s |