Scanning electron microscopy: Proceedings of the Annual Scanning Electron Microscopy Symposium 1977,1. 10. Annual Scanning Electron Microscope Symposium and Workshops on Materials and Component Characterization/ Quality Control with the SEM/STEM, SEM Applications to Semiconductors, Analytical Electron Microscopy, Biological Specimen Preparation for SEM. March 28 - Apr. 1, 1977
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Chicago, Ill.
1977
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Internformat
MARC
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Datensatz im Suchindex
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| spelling | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1977,1. 10. Annual Scanning Electron Microscope Symposium and Workshops on Materials and Component Characterization/ Quality Control with the SEM/STEM, SEM Applications to Semiconductors, Analytical Electron Microscopy, Biological Specimen Preparation for SEM. March 28 - Apr. 1, 1977 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* 1977 Chicago, Ill. txt rdacontent n rdamedia nc rdacarrier Johari, Om Sonstige oth Scanning Electron Microscope Symposium Sonstige (DE-588)2880-0 oth (DE-604)BV009381834 1977,1 |
| spellingShingle | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_auth | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_exact_search | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_full | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1977,1. 10. Annual Scanning Electron Microscope Symposium and Workshops on Materials and Component Characterization/ Quality Control with the SEM/STEM, SEM Applications to Semiconductors, Analytical Electron Microscopy, Biological Specimen Preparation for SEM. March 28 - Apr. 1, 1977 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_fullStr | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1977,1. 10. Annual Scanning Electron Microscope Symposium and Workshops on Materials and Component Characterization/ Quality Control with the SEM/STEM, SEM Applications to Semiconductors, Analytical Electron Microscopy, Biological Specimen Preparation for SEM. March 28 - Apr. 1, 1977 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_full_unstemmed | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1977,1. 10. Annual Scanning Electron Microscope Symposium and Workshops on Materials and Component Characterization/ Quality Control with the SEM/STEM, SEM Applications to Semiconductors, Analytical Electron Microscopy, Biological Specimen Preparation for SEM. March 28 - Apr. 1, 1977 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy proceedings of the annual scanning electron microscopy symposium |
| title_sub | Proceedings of the Annual Scanning Electron Microscopy Symposium |
| volume_link | (DE-604)BV009381834 |
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