Verfügbarkeit: Practical scanning electron microscopy

Practical scanning electron microscopy: electron and ion microprobe analysis

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Bibliographische Detailangaben
Vorheriger Titel:	Scanning electron microscopy and x-ray microanalysis
Format:	Buch
Sprache:	English
Veröffentlicht:	New York Plenum Press 1977
Ausgabe:	3. print.
Schlagworte:	Messtechnik Rasterelektronenmikroskopie Elektronenmikroskopie Elektronenoptik Material Elektronenstrahlmikroanalyse
Beschreibung:	XVIII, 582 S. Ill., graph. Darst.
ISBN:	0306308207

Internformat

MARC


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Datensatz im Suchindex

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discipline	Allgemeine Naturwissenschaft Physik
edition	3. print.
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id	DE-604.BV009230425
illustrated	Illustrated
indexdate	2024-07-09T17:33:32Z
institution	BVB
isbn	0306308207
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-006138897
oclc_num	256270445
open_access_boolean
owner	DE-29T DE-706 DE-188
owner_facet	DE-29T DE-706 DE-188
physical	XVIII, 582 S. Ill., graph. Darst.
publishDate	1977
publishDateSearch	1977
publishDateSort	1977
publisher	Plenum Press
record_format	marc
spelling	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ... 3. print. New York Plenum Press 1977 XVIII, 582 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Messtechnik (DE-588)4114575-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Material (DE-588)4169078-3 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s 1\p DE-604 Elektronenoptik (DE-588)4151879-2 s 2\p DE-604 Material (DE-588)4169078-3 s 3\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 4\p DE-604 Messtechnik (DE-588)4114575-6 s 5\p DE-604 Goldstein, Joseph I. Sonstige oth Ausg. 1971 u.d.T. Scanning electron microscopy and x-ray microanalysis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Practical scanning electron microscopy electron and ion microprobe analysis Messtechnik (DE-588)4114575-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenoptik (DE-588)4151879-2 gnd Material (DE-588)4169078-3 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd
subject_GND	(DE-588)4114575-6 (DE-588)4048455-5 (DE-588)4014327-2 (DE-588)4151879-2 (DE-588)4169078-3 (DE-588)4151898-6
title	Practical scanning electron microscopy electron and ion microprobe analysis
title_auth	Practical scanning electron microscopy electron and ion microprobe analysis
title_exact_search	Practical scanning electron microscopy electron and ion microprobe analysis
title_full	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...
title_fullStr	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...
title_full_unstemmed	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...
title_old	Scanning electron microscopy and x-ray microanalysis
title_short	Practical scanning electron microscopy
title_sort	practical scanning electron microscopy electron and ion microprobe analysis
title_sub	electron and ion microprobe analysis
topic	Messtechnik (DE-588)4114575-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenoptik (DE-588)4151879-2 gnd Material (DE-588)4169078-3 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd
topic_facet	Messtechnik Rasterelektronenmikroskopie Elektronenmikroskopie Elektronenoptik Material Elektronenstrahlmikroanalyse
work_keys_str_mv	AT goldsteinjosephi practicalscanningelectronmicroscopyelectronandionmicroprobeanalysis

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