Special section on the 1987 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems:
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Bibliographic Details
Corporate Author: Conference on Measurement and Modeling of Computer Systems Banff, Alberta (Author)
Format: Conference Proceeding Book
Language:English
Published: New York, NY 1988
Subjects:
Item Description:In: Institute of Electrical and Electronics Engineers: IEEE transactions on software engineering 14 (1988) 4
Physical Description:S. 521 - 553

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